Nonlinear Offset Measurement and Nullification for Effective Resistive Sensor Design

Abstract

Over the decades, a number of methodologies have been introduced to meliorate the resistive sensor measurement protocol for complete knowledge of the phenomenon of interest. Nonetheless, such setting requires high degree of circuit components that result high level of errors (i.e., nonlinear) and thereby, its minimization for effective design is an open question. This article presents a technique that utilizes direct resistive circuit with microcontroller ($\mu C$), followed by subsequent estimation of curve-fitting models (CFMs) to curtail the errors involved and implementation in $\mu C$ to update real-time data. Further, the study exploited the effectiveness of various employed CFMs in this context. The significant aftermaths with suitable choice of CFM and subsequent comparison with the state-of-the-art approaches manifest the efficacy of the adopted scheme.