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Intensity Statistics and Normalization

  • Chapter
Direct Methods for Solving Macromolecular Structures

Part of the book series: NATO ASI Series ((ASIC,volume 507))

Abstract

The “fundamental theorem” of X-ray crystallography is (see, e.g., Coppens, 1996; Bricogne, 1996) the dual-space Fourier transform relationship

$$F(h)\rho (r)$$
((1))

between crystal structure factors in reciprocal space,

$$F(h) = T[\rho (r)] = \int\limits_v {{d^3}r\rho (r)\exp + (2\pi ih \bullet r)} $$
((2))

and the unit-cell electron density distribution in crystal space,

$$\rho (r) = {T^{ - 1}}[F(h)] = {V^{ - 1}}\sum\nolimits_h {F(h)exp( - 2\pi ih \bullet r)} $$
((3))

.

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Authors and Affiliations

  1. Hauptman-Woodward Institute, 73 High Street, Buffalo, New York, 14203-1196, USA

    Robert H. Blessing, D. Y. Guo & David A. Langs

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  1. Robert H. Blessing
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  2. D. Y. Guo
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  3. David A. Langs
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Editors and Affiliations

  1. Departments of Chemistry and Computing and Information Science, Queen’s University, Kingston, Ontario, Canada

    Suzanne Fortier

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Blessing, R.H., Guo, D.Y., Langs, D.A. (1998). Intensity Statistics and Normalization. In: Fortier, S. (eds) Direct Methods for Solving Macromolecular Structures. NATO ASI Series, vol 507. Springer, Dordrecht. https://doi.org/10.1007/978-94-015-9093-8_6

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  • DOI: https://doi.org/10.1007/978-94-015-9093-8_6

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