Abstract
In the first part, we introduced experimental results of the internal quantum efficiency (IQE) droop depending on temperature in both the electroluminescence and the resonant photoluminescence. The IQE droop mechanisms ever reported are reviewed. An inherent origin of the efficiency droop is suggested to be the saturation of the radiative recombination rate in the InGaN quantum well at low current and subsequent increase in the nonradiative recombination rates at high current. The degree of saturation is largely influenced by operating temperature and the effective active volume. Although the saturation of the radiative recombination rate is the common origin of the IQE droop, the shapes of the IQE versus current, i.e. the IQE droop curve, vary with the dominant nonradiative recombination process. In the second part, we have reviewed the IQE measurement methods theoretically as well as experimentally. A simple IQE estimation method based on the constant ABC model in the carrier rate equation is introduced in terms of its convenience and application limitation. Other methods have been also reviewed by focusing on all-optical methods such as the temperature-dependent photoluminescence (TDPL) and the temperature-dependent time-resolved photoluminescence (TD-TRPL) methods.
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References
E.F. Schubert, Light-Emitting Diodes (Cambridge University Press, New York, 2010)
Y. Yang, X.A. Cao, C.H. Yan, Appl. Phys. Lett. 94, 041117 (2009)
X.A. Cao, A. Teetsova, F. Shahedipour-Sandvikb, S.D. Arthura, J. Cryst. Growth 264, 172 (2004)
B. Monemar, B.E. Sernelius, Appl. Phys. Lett. 91, 181103 (2007)
S. Choi, H.J. Kim, S.-S. Kim, J. Liu, J. Kim, J.-H. Ryou, R.D. Dupuis, A.M. Fischer, F.A. Ponce, Appl. Phys. Lett. 96, 221105 (2010)
J. Yun, D.-P. Han, J.-I. Shim, D.-S. Shin, IEEE Trans. Electron Devices 59, 1799 (2012)
S. Hwang, J.-I. Shim, IEEE Trans. Electron Devices 55, 1123 (2008)
G.P. Agrawal, N.K. Dutta, Semiconductor Lasers, 2nd edn. (Van Norstrand Reinhold, New York, 1993)
I. Schnitzer, E. Yablonovitch, C. Caneau, T.J. Gmitter, A. Scherer, Appl. Phys. Lett. 63, 2174 (1993)
A.I. Zhmakin, Phys. Rep. 498, 189 (2011)
M. Peter, A. Laubsch, W. Bergbauer, T. Meyer, M. Sabathil, J. Baur, B. Hahn, Phys. Status Solidi A 206, 1125 (2009)
A. Laubsch, M. Sabathil, W. Bergbauer, M. Strassburg, H. Lugauer, M. Peter, S. Lutgen, N. Linder, K. Streubel, J. Hader, J.V. Moloney, B. Pasenow, S.W. Koch, Phys. Status Solidi C 6, 913 (2009)
A. Laubsch, M. Sabathil, J. Baur, M. Peter, B. Hahn, IEEE Trans. Electron Devices 57, 79 (2010)
A.A. Efremov, N.I. Bochkareva, R.I. Gorbunov, D.A. Lavrinovich, Y.T. Rebane, D.V. Tarkhin, Y.G. Shreter, Semiconductors 40, 605 (2006)
M.-H. Kim, M.F. Schubert, Q. Dai, J.K. Kim, E.F. Schubert, J. Piprek, Y. Park, Appl. Phys. Lett. 91, 183507 (2007)
K. Fujiwara, H. Jimi, K. Kaneda, Phys. Status Solidi C 6, 814 (2009)
X. Li, X. Ni, J. Lee, M. Wu, U. Özgür, H. Morkoç, T. Paskova, G. Mulholland, K.R. Evans, Appl. Phys. Lett. 95, 121107 (2009)
Y.-D. Lin, A. Chakraborty, S. Brinkley, H.C. Kuo, T. Melo, K. Fujito, J.S. Speck, S.P. DenBaars, S. Nakamura, Appl. Phys. Lett. 94, 261108 (2009)
S.-P. Chang, T.-C. Lu, L.-F. Zhuo, C.-Y. Jang, D.-W. Lin, H.-C. Yang, H.-C. Kuo, S.-C. Wang, J. Electrochem. Soc. 157, 501 (2010)
N.F. Gardner, G.O. Müller, Y.C. Shen, G. Chen, S. Watanabe, W. Götz, M.R. Krames, Appl. Phys. Lett. 91, 243506 (2007)
Y. Yang, X.A. Cao, C.H. Yan, Phys. Status Solidi A 206, 195 (2009)
J. Xie, X. Ni, Q. Fan, R. Shimada, U. Özgür, H. Morkoç, Appl. Phys. Lett. 93, 121107 (2008)
D.S. Meyaard, G.B. Lin, Q. Shan, J. Cho, E.F. Schubert, H. Shim, M.H. Kim, C. Sone, Appl. Phys. Lett. 99, 251115 (2011)
J. Hader, J.V. Moloney, S.W. Koch, Appl. Phys. Lett. 96, 221106 (2010)
J. Hader, J.V. Moloney, B. Pasenow, S.W. Koch, M. Sabathil, N. Linder, S. Lutgen, Appl. Phys. Lett. 92, 261103 (2008)
K.T. Delaney, P. Rinke, C.G. Van de Walle, Appl. Phys. Lett. 94, 191109 (2009)
B. Pasenow, S.W. Koch, J. Hader, J.V. Moloney, M. Sabathil, N. Linder, S. Lutgen, Phys. Status Solidi C 6, 864 (2009)
J.-I. Shim, D.-S. Shin, H.-S. Kim, H.-Y. Ryu, J. Korean Phys. Soc. 58, 503 (2011)
D.-S. Shin, D.-P. Han, J.-Y. Oh, J.-I. Shim, Appl. Phys. Lett. 100, 153506 (2012)
F. Bertazzi, M. Goano, E. Bellotti, Appl. Phys. Lett. 97, 231118 (2010)
J. Piprek, Phys. Status Solidi A 207, 2217 (2010)
S.Y. Karpov, Proc. SPIE 7939, 79391 (2011)
M.H. Crawford, IEEE J. Sel. Top. Quantum Electron. 15, 1028 (2009)
D. Saguatti, L. Bidinelli, G. Verzellesi, M. Meneghini, G. Meneghesso, E. Zanoni, R. Butendeich, B. Hahn, IEEE Trans. Electron Devices 59, 1402 (2012)
M. Zhang, P. Bhattacharya, J. Singh, J. Hinckley, Appl. Phys. Lett. 95, 201108 (2009)
M. Meneghini, N. Trivellin, G. Meneghesso, E. Zanoni, U. Zehnder, B. Hahn, J. Appl. Phys. 106, 114508 (2009)
Q. Dai, Q. Shan, J. Wang, S. Chhajed, J. Cho, E.F. Schubert, M.H. Crawford, D.D. Koleske, M.-H. Kim, Y. Park, Appl. Phys. Lett. 97, 133507 (2010)
U. Özgur, H. Liu, X. Li, X. Ni, H. Morkoç, Proc. IEEE 98, 1180 (2010)
H.-Y. Ryu, H.-S. Kim, J.-I. Shim, Appl. Phys. Lett. 95, 081114 (2009)
S.F. Chichibu, A. Uedono, T. Onuma, B.A. Haskell, A. Chakraborty, T. Koyama, P.T. Fini, S. Keller, S.P. DenBaars, J.S. Speck, U.K. Mishra, S. Nakamura, S. Yamaguchi, S. Kamiyama, H. Amano, I. Akasaki, J. Han, T. Sota, Nat. Mater. 5, 810 (2006)
S.F. Chichibu, T. Sota, K. Wada, O. Brandt, K.H. Ploog, S.P. DenBaars, S. Nakamura, Phys. Status Solidi A 183, 91 (2001)
K. Okamoto, A. Scherer, Y. Kawakami, Appl. Phys. Lett. 87, 161104 (2005)
A. Kaneta, K. Okamoto, Y. Kawakami, S. Fujita, G. Marutsuki, Y. Narukawa, T. Mukai, Appl. Phys. Lett. 81, 4353 (2002)
M.F. Schubert, S. Chhajed, J.K. Kim, E.F. Schubert, D.D. Koleske, M.H. Crawford, S.R. Lee, A.J. Fischer, G. Thaler, M.A. Banas, Appl. Phys. Lett. 91, 231114 (2007)
M.F. Schubert, J. Xu, J.K. Kim, E.F. Schubert, M.H. Kim, S. Yoon, S.M. Lee, C. Sone, T. Sakong, Y. Park, Appl. Phys. Lett. 93, 041102 (2008)
J. Xu, M.F. Schubert, A.N. Noemaun, D. Zhu, J.K. Kim, E.F. Schubert, M.H. Kim, H.J. Chung, S. Yoon, C. Sone, Y. Park, Appl. Phys. Lett. 94, 011113 (2009)
S. Hwang, W.J. Ha, J.K. Kim, J. Xu, J. Cho, E.F. Schubert, Appl. Phys. Lett. 99, 181115 (2011)
J. Lee, X. Li, X. Ni, U. Özgür, H. Morkoç, T. Paskova, G. Mulholland, K.R. Evans, Appl. Phys. Lett. 95, 201113 (2009)
C.H. Wang, C.C. Ke, C.Y. Lee, S.P. Chang, W.T. Chang, J.C. Li, Z.Y. Li, H.C. Yang, H.C. Kuo, T.C. Lu, S.C. Wang, Appl. Phys. Lett. 97, 261103 (2010)
Y.Y. Kudryk, A.V. Zinovchuk, Semicond. Sci. Technol. 26, 095007 (2011)
Y.-K. Kuo, M.-C. Tsai, S.-H. Yen, T.-C. Hsu, Y.-J. Shen, IEEE J. Quantum Electron. 46, 1214 (2010)
R.-M. Lin, M.-J. Lai, L.-B. Chang, C.-H. Huang, Appl. Phys. Lett. 97, 181108 (2010)
C.-L. Chao, R. Xuan, H.-H. Yen, C.-H. Chiu, Y.-H. Fang, Z.-Y. Li, B.-C. Chen, C.-C. Lin, C.-H. Chiu, Y.-D. Guo, H.-C. Kuo, J.-F. Chen, S.-J. Cheng, IEEE Photonics Technol. Lett. 23, 798 (2011)
C.H. Wang, S.P. Chang, W.T. Chang, J.C. Li, Y.S. Lu, Z.Y. Li, H.C. Yang, H.C. Kuo, T.C. Lu, S.C. Wang, Appl. Phys. Lett. 97, 181101 (2010)
S. Tanaka, Y. Zhao, I. Koslow, C.-C. Pan, H.-T. Chen, J. Sonoda, S.P. DenBaars, S. Nakamura, IEE Electron. Lett. 47, 339 (2011)
Y.-J. Lee, C.-H. Chen, C.-J. Lee, IEEE Photonics Technol. Lett. 22, 1506 (2010)
Y.-L. Li, Y.-R. Huang, Y.-H. Lai, IEEE J. Sel. Top. Quantum Electron. 15, 1128 (2009)
X. Ni, X. Li, J. Lee, S. Liu, V. Avrutin, Ü. Özgür, H. Morkoç, A. Matulionis, T. Paskova, G. Mulholland, K.R. Evans, Appl. Phys. Lett. 97, 031110 (2010)
Y.B. Tao, S.Y. Wang, Z.Z. Chen, Z. Gong, E.Y. Xie, Y.J. Chen, Y.F. Zhang, J. McKendry, D. Massoubre, E.D. Gu, B.R. Rae, R.K. Henderson, G.Y. Zhang, Phys. Status Solidi C 9, 616 (2012)
J.-I. Shim, D.-P. Han, H. Kim, D.-S. Shin, G.-B. Lin, D.S. Meyaard, Q. Shan, J. Cho, E.F. Schubert, H. Shim, C. Sone, Appl. Phys. Lett. 100, 111106 (2012)
D.L. Huffaker, D.G. Deppe, Appl. Phys. Lett. 73, 520 (1998)
A. Hori, D. Yasunaga, A. Satake, K. Fujiwara, J. Appl. Phys. 93, 3152 (2003)
S. Chhajed, J. Cho, E.F. Schubert, J.K. Kim, D.D. Koleske, M.H. Crawford, Phys. Status Solidi A 208, 947 (2011)
T.S. Jeong, C.J. Youn, M.S. Han, J.W. Yang, K.Y. Lim, J. Cryst. Growth 259, 267 (2003)
M. lIegems, R. Dingle, J. Appl. Phys. 44, 4234 (1973)
I. Akasaki, H. Amano, M. Kito, K. Hiramatsu, J. Lumin. 48 & 49, 666 (1991)
E. Oh, H. Park, Y. Park, Appl. Phys. Lett. 72, 70 (1998)
J.P. Liu, J.-H. Ryou, R.D. Dupuis, J. Han, G.D. Shen, Appl. Phys. Lett. 93, 021102 (2008)
K. Ding, Y.P. Zeng, X.C. Wei, Z.C. Li, J.X. Wang, H.X. Lu, P.P. Cong, X.Y. Yi, G.H. Wang, J.M. Li, Appl. Phys. B 97, 465 (2009)
H.-Y. Ryu, J.-I. Shim, C.-H. Kim, J.H. Choi, H.M. Jung, M.-S. Noh, J.-M. Lee, E.-S. Nam, IEEE Photonics Technol. Lett. 23, 1866 (2011)
S. Hammersley, D. Watson-Parris, P. Dawson, M.J. Godfrey, T.J. Badcock, J. Appl. Phys. 111, 083512 (2012)
J.-W. Shi, C.-W. Lin, M.L. Lee, J.-K. Sheu, IEEE Photon. Technol. Lett. 23, 1585 (2011)
A. David, M.J. Grundmann, Appl. Phys. Lett. 96, 103504 (2010)
H. Kim, D.-P. Han, J.-Y. Oh, J.-I. Shim, J. Korean Phys. Soc. 60, 1934 (2012)
G. Tamulaitis, J. Mickevičius, D. Dobrovolskas, E. Kuokštis, M.S. Shur, M. Shatalov, J. Yang, R. Gaska, Phys. Status Solidi C 9, 1677 (2012)
M.F. Schubert, J. Xu, Q. Dai, F.W. Mont, J.K. Kim, E.F. Schubert, Appl. Phys. Lett. 94, 081114 (2009)
G.H. Gu, C.G. Park, K.B. Nam, Phys. Status Solidi RRL 3, 100 (2009)
P.G. Eliseev, M. Osin’ski, H. Li, I.V. Akimova, Appl. Phys. Lett. 75, 3838 (1999)
T. Miyoshi, T. Yanamoto, T. Kozaki, S.-i. Nagahama, Y. Narukawa, M. Sano, T. Yamada, T. Mukai, Proc. SPIE, 689414 (2008)
G. Chen, M. Craven, A. Kim, A. Munkholm, S. Watanabe, M. Camras, W. Götz, F. Steranka, Phys. Status Solidi A 205, 1086 (2008)
Y. Narukawa, J. Narita, T. Sakamoto, T. Yamada, H. Narimatsu, M. Sano, T. Mukai, Phys. Status Solidi A 204, 2087 (2007)
T. Fleck, M. Schmidt, C. Klingshirn, Phys. Status Solidi A 198, 248 (2003)
H. Gauck, T.H. Gfroerer, M.J. Renn, E.A. Cornell, K.A. Bertness, Appl. Phys. A 64, 143 (1997)
I. Schnitzer, E. Yablonovitch, C. Caneau, T.J. Gmitter, Appl. Phys. Lett. 62, 131 (1993)
V. Zabelin, D.A. Zakheim, S.A. Gurevich, IEEE J. Quantum Electron. 40, 1675 (2004)
R. Windisch, C. Rooman, B. Dutta, A. Knobloch, G. Borghs, G.H. Döhler, P. Heremans, IEEE J. Sel. Top. Quantum Electron. 8, 248 (2002)
S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, Appl. Phys. Lett. 69, 1568 (1996)
H.Y. Ryu, K.H. Ha, J.H. Chae, K.S. Kim, J.K. Son, Appl. Phys. Lett. 89, 171106 (2006)
S. Saito, T. Narita, K. Zaima, K. Tachibana, H. Nago, G.-I. Hatakoshi, S. Nunoue, Phys. Status Solidi C 5, 2195 (2008)
Y. Kawakami, K. Omae, K. Okamoto, T. Izumi, S. Sauou, K. Inoue, Y. Narukawa, T. Mukai, Sg. Fujita, Phys. Status Solidi A 183, 41 (2001)
S. Watanabe, N. Yamada, M. Nagashima, Y. Ueki, C. Sasaki, Appl. Phys. Lett. 83, 4906 (2003)
S. Lahmann, F. Hitzel, U. Rossow, A. Hangleiter, Phys. Status Solidi C 0, 2202 (2003)
A. Hangleiter, D. Fuhrmann, M. Grewe, F. Hitzel, G. Klewer, S. Lahmann, C. Netzel, A. riedel, U. Rossow, Phys. Status Solidi A 201, 2808 (2004)
D. Fuhrmann, T. Retzlaff, U. Rossow, H. Bremers, A. Hangleiter, Appl. Phys. Lett. 88, 191108 (2006)
E.Y. Lin, C.Y. Chen, T.S. Lay, T.C. Wang, J.D. Tsay, P.X. Peng, T.Y. Lin, Phys. Status Solidi C 5, 2111 (2008)
C. Netzel, R. Doloca, S. Lahmann, U. Rossow, A. Hangleiter, Phys. Status Solidi C 0, 324 (2002)
C. Netzel, S. Heppel, F. Hitzel, S. Miller, A. Weimar, G. Brüderl, H.J. Lugauer, A. Lell, V. Härle, A. Hangleiter, Phys. Status Solidi C 0, 2304 (2003)
M.S. Minsky, S. Watanabe, N. Yamada, J. Appl. Phys. 91, 5176 (2002)
J.S. Hwang, A. Gokarna, Y.-H. Cho, J.K. Son, S.N. Lee, Appl. Phys. Lett. 90, 131908 (2007)
J.S. Hwang, A. Gokarna, Y.-H. Cho, J.K. Son, S.N. Lee, J. Appl. Phys. 102, 013508 (2007)
J.K. Son, S.N. Lee, H.S. Paek, T. Sakong, K.H. Ha, O.H. Nam, Y. Park, Phys. Status Solidi C 4, 2780 (2007)
A. Reale, G. Massari, A.D. Carlo, P. Lugli, A. Vinattieri, J. Appl. Phys. 93, 400 (2003)
R. Olshansky, C.B. Su, J. Manning, W. Powazinik, IEEE J. Quantum Electron. 20, 838 (1984)
Y.J. Ding, C.L. Guo, J.B. Khurgin, K.K. Law, J.L. Merz, Appl. Phys. Lett. 60, 2051 (1992)
J.-B. Wang, D. Ding, S.R. Johnson, S.-Q. Yu, Y.-H. Zhang, Phys. Status Solidi B 244, 2740 (2007)
Q. Dai, M.F. Schubert, M.H. Kim, J.K. Kim, E.F. Schubert, D.D. Koleske, M.H. Crawford, S.R. Lee, A.J. Fischer, G. Thaler, M.A. Banas, Appl. Phys. Lett. 94, 111109 (2009)
J.-I. Shim, B. Liu, J.E. Bowers, IEEE J. Quantum Electron. 40, 1622 (2004)
C.-K. Sun, S. Keller, G. Wang, M.S. Minsky, J.E. Bowers, S.P. DenBaars, Appl. Phys. Lett. 69, 1936 (1996)
C.-K. Sun, S. Keller, T.-L. Chiu, G. Wang, M.S. Minsky, J.E. Bowers, S.P. DenBaars, IEEE J. Sel. Top. Quantum Electron. 3, 731 (1997)
Y. Kawakami, Z.G. Peng, Y. Narukawa, S. Fujita, S. Fujita, Appl. Phys. Lett. 69, 1414 (1996)
M.-Y. Ryu, C.Q. Chen, E. Kuokstis, J.W. Yang, G. Simin, Appl. Phys. Lett. 80, 3943 (2002)
S.F. Chichibu, M. Suguyama, T. Onuma, T. Kitamura, H. Nakanishi, T. Kuroda, A. Takeuchi, T. Soda, Y. Ishida, H. Okumura, Appl. Phys. Lett. 79, 4319 (2001)
H. Kim, D.-S. Shin, H.-Y. Ryu, J.-I. Shim, Jpn. J. Appl. Phys. 49, 112402 (2010)
X.A. Cao, E.B. Stokes, P.M. Sandvik, S.F. LeBoeuf, J. Kretchmer, D. Walker, IEEE Electron Device Lett. 23, 535 (2002)
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Shim, JI. (2013). Active Region Part B. Internal Quantum Efficiency. In: Seong, TY., Han, J., Amano, H., Morkoc, H. (eds) III-Nitride Based Light Emitting Diodes and Applications. Topics in Applied Physics, vol 126. Springer, Dordrecht. https://doi.org/10.1007/978-94-007-5863-6_7
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