Abstract
In this chapter, we study the resolution of a TEM and its image contrast by a simple optical theory. The introductory explanations of bright-field and dark-field images are also given for beginners.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Born, M., & Wolf, E. (1970). Principles of optics. Oxford: Pergamon Press.
Cockayne, D. J. H. (1969). Philosophical Magazine, 20, 1265.
Hedenreich, R. (1964). Fundamentals of transmission electron microscopy. New York: Interscience Publisher.
Hirsch, P. B., et al. (1977). Electron microscopy for thin crystals. Florida: Krieger.
Hopkins, H. H., & Barham, P. M. (1950). Proceedings of the Physical Society, B63, 737.
Ishizuka, K. (1980). Ultramicroscopy, 5, 55.
O’Keefe, M. (1979). Proceedings 37 th Annual Meeting of EMSA (San Antonio), pp. 556.
Scherzer, O. (1936). Zeitschrift für Physik, 101, 593.
Scherzer, O. (1949). Journal of Applied Physics, 20, 20.
Thon, F. (1966). Zeitschrift fur Naturforchung, 21, 476.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2017 Springer Japan KK
About this chapter
Cite this chapter
Tanaka, N. (2017). Resolution and Image Contrast of a Transmission Electron Microscope (TEM). In: Electron Nano-Imaging. Springer, Tokyo. https://doi.org/10.1007/978-4-431-56502-4_4
Download citation
DOI: https://doi.org/10.1007/978-4-431-56502-4_4
Published:
Publisher Name: Springer, Tokyo
Print ISBN: 978-4-431-56500-0
Online ISBN: 978-4-431-56502-4
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)