Advertisement

Electron Nano-Imaging

Basics of Imaging and Diffraction for TEM and STEM

  • Nobuo Tanaka

Table of contents

  1. Front Matter
    Pages i-xxviii
  2. Nano-imaging by Transmission Electron Microscopy

  3. Nano-imaging by Scanning Transmission Electron Microscopy

    1. Front Matter
      Pages 147-147
    2. Nobuo Tanaka
      Pages 191-202
    3. Nobuo Tanaka
      Pages 213-215
  4. Appendix: Basics for Understanding TEM and STEM Imaging

  5. Back Matter
    Pages 313-333

About this book

Introduction

In the present book, the basics of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in textbook style. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, mechanism of electron lens, and scattering/diffraction theories, which are explained in detail separately in the appendices.  A comprehensive explanation is provided using Fourier transform theory. This approach is unique in comparison with other advanced textbooks on high-resolution electron microscopy.  With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by facts about electron microscopic imaging. The up-to-date information in this book, particularly for imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.

Keywords

Bethe Method Cowley's Theory Electron Wave Optics Energy-filtered Transmission Electron Microscopy High-resolution Electron Microscopy Howies–Whelan Method Lattice Fringe Images Magnetic Lenses Van Dyck Method

Authors and affiliations

  • Nobuo Tanaka
    • 1
  1. 1.Nagoya UniversityNagoyaJapan

Bibliographic information