This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Buseck, P., et al. (1988). High-resolution electron microscopy. Oxford: Oxford Univ. Press.
Scherzer, O. (1949). Journal of Applied Physics, 20, 20.
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
Copyright information
© 2017 Springer Japan KK
About this chapter
Cite this chapter
Tanaka, N. (2017). Cowley’s Theory for TEM and STEM Imaging. In: Electron Nano-Imaging. Springer, Tokyo. https://doi.org/10.1007/978-4-431-56502-4_19
Download citation
DOI: https://doi.org/10.1007/978-4-431-56502-4_19
Published:
Publisher Name: Springer, Tokyo
Print ISBN: 978-4-431-56500-0
Online ISBN: 978-4-431-56502-4
eBook Packages: Chemistry and Materials ScienceChemistry and Material Science (R0)