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Développement d’accessoires adaptables au microanalyseur à sonde électronique pour l’étude des inclusions

  • Conference paper
Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

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Résumé

L’analyse élémentaire des inclusions constitue un domaine important des applications du microanalyseur à sonde électronique.

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Bibliographie

  1. Theisen: Mém. Sci. Rev. Met. 60, 1/8, No 3.

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  2. Melford: Optique des rayons X et microanalyse, p. 497–505. Hermann, Paris 1966.

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  3. Dörfler, G., et E. Plöcxnvwer: Optique des rayons X et microanalyse, p. 506–512. Hermann, Paris 1966.

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  4. Duncumb, P.: Technical Report, No 182. Tube Investments Research Laboratories.

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Author information

Authors and Affiliations

  1. CAMECA, Courbevoie, France

    C. Conty, J.-M. Rouberol & M. Tong

Authors
  1. C. Conty
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  2. J.-M. Rouberol
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  3. M. Tong
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Editor information

Editors and Affiliations

  1. Institut für angewandte Physik, Universität, 74 Tübingen, Germany

    G. Möllenstedt  & K. H. Gaukler  & 

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© 1969 Springer-Verlag Berlin Heidelberg

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Conty, C., Rouberol, JM., Tong, M. (1969). Développement d’accessoires adaptables au microanalyseur à sonde électronique pour l’étude des inclusions. In: Möllenstedt, G., Gaukler, K.H. (eds) Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-12108-5_44

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  • DOI: https://doi.org/10.1007/978-3-662-12108-5_44

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-12110-8

  • Online ISBN: 978-3-662-12108-5

  • eBook Packages: Springer Book Archive

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