Vth International Congress on X-Ray Optics and Microanalysis / V. Internationaler Kongreß für Röntgenoptik und Mikroanalyse / Ve Congrès International sur l’Optique des Rayons X et la Microanalyse

Tübingen, September 9th–14th, 1968

  • G. Möllenstedt
  • K. H. Gaukler

Table of contents

  1. Front Matter
    Pages I-XII
  2. X-Ray Optics

    1. J. F. Mcgee, D. R. Hesser, J. W. Milton
      Pages 11-26
    2. J. F. Mcgee, I. M. Arrazola
      Pages 27-32
    3. W. P. Reidy, R. Giacconi, G. Vaiana, L. van Speybroeck, T. Zehnpfennig
      Pages 39-44
  3. Electron Probe Microanalysis. Physical Bases

  4. Electron Probe Microanalysis. Quantitative Analysis

    1. P. Duncumb, P. K. Shields-Mason, C. da Casa
      Pages 146-150
    2. Gunji Shinoda
      Pages 175-179
    3. R. Tixier, J. Philibert
      Pages 180-186
    4. M. J. Henoc, Mlle F. Maurice, Mme A. Zemskoff
      Pages 187-192
  5. Instrumentation

    1. L. Hailes
      Pages 219-223
    2. R. Bassett, T. Mulvey
      Pages 224-230
    3. P. F. Chapman
      Pages 241-244
    4. V. G. Macres, O. Preston, N. C. Yew, R. Buchanan
      Pages 248-249
    5. L. A. Fontijn, A. B. Bok, J. G. Kornet
      Pages 261-268
    6. J. B. Nicholson, H. Neuhaus, M. F. Hasler
      Pages 269-273
    7. J.-M. Rouberol, J. Guernet, P. Deschamps, J.-P. et Dagnot, J.-M. Guyon de la Berge
      Pages 311-318

About these proceedings


The Fifth International Congress on X-Ray Optics and Microanalysis was organized by the Institute of Applied Physics at Tübingen University in Western Germany from September 9th through 14th, 1968. Since 1956, when the First Conference was arranged in Cambridge, England by one of the pioneers in this field, V. E. CossLETT, the experts in the fields of X-Ray Optics and Microanalysis have met every third year to exchange their scientific experiences. Later meetings were held at Uppsala, Sweden in 1959, at Stanford, California in 1962, and at Orsay, Francein 1965. The participants in the 1968 Conference came from the following countries: Germany 140, France 60, Great Britain 55, USA 20, Netherlands 16, Switzerland 12, Austria 9, Sweden 7, Belgium 6, Japan 5, Italy 4, two each from Israel, Yugoslavia, Canada, Norway, Hungary and one each from Argentine, Poland, South Africa. As at the latest congress in Paris the following central topics were treated: General problems of X-ray optics, physical bases of electron beam microanalysis, quantitative problems of X-ray microanalysis, instrumentation, microdiffraction, applications to metal­ lurgy, mineralogy, and biology. An exhibition showing some of the most modern instruments formed an important part of the conference. The Springer-Verlag, Heidelberg, deserves thanks for the careful and speedy work they have performed in printing these conference proceedings. We are further indebted to all contributors of this volume for their kind cooperation. Tübingen, August 1969 G. MöLLENSTEDT and K. H.


Mikroanalyse Wellen X-ray astronomy density diffraction diffusion electron energy fields lens metals neutron optics physics

Editors and affiliations

  • G. Möllenstedt
    • 1
  • K. H. Gaukler
    • 1
  1. 1.Institut für angewandte PhysikUniversität74 TübingenGermany

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 1969
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-662-12110-8
  • Online ISBN 978-3-662-12108-5
  • Buy this book on publisher's site