Abstract
In this chapter a Rietveld procedure that is useful in performing the quantitative phase analysis of semi-crystalline materials without using an internal standard is described and some applications are reported. Although the applicability of this method is not as wide as the internal standard one, it represents a valid alternative when the standard cannot be added to the sample, e.g. in bulk materials. This method can only be applied if the chemical composition of the amorphous phase or, as an alternative, of the whole sample is known. This limitation can be a serious problem in the study of natural materials, but it usually does not constitute a problem in the study of synthetic products the composition of which is well known.
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Riello, P. (2004). Quantitative Analysis of Amorphous Fraction in the Study of the Microstructure of Semi-crystalline Materials. In: Mittemeijer, E.J., Scardi, P. (eds) Diffraction Analysis of the Microstructure of Materials. Springer Series in Materials Science, vol 68. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-06723-9_7
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DOI: https://doi.org/10.1007/978-3-662-06723-9_7
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