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Diffraction Analysis of the Microstructure of Materials

  • Eric J. Mittemeijer
  • Paolo Scardi

Part of the Springer Series in Materials Science book series (SSMATERIALS, volume 68)

Table of contents

  1. Front Matter
    Pages I-XXV
  2. Retrospective on Line-Broadening Analysis

    1. Front Matter
      Pages 1-1
  3. Analysis of the Full Diffraction Pattern

  4. Crystallite Size and Shape

    1. Front Matter
      Pages 185-185
    2. R. Kužel, V. Holý, M. Čerňanský, J. Kubéna, D. Šimek, J. Kub
      Pages 229-245
  5. Dislocations and Stacking Faults

    1. Front Matter
      Pages 247-247
    2. J.-D. Kamminga, L. J. Seijbel, R. Delhez
      Pages 309-331
    3. A. I. Ustinov, L. O. Olikhovska, N. M. Budarina, F. Bernard
      Pages 333-359
  6. Grain Interaction

    1. Front Matter
      Pages 361-361
    2. R. E. Bolmaro, H. G. Brokmeier, J. W. Signorelli, A. Fourty, M. A. Bertinetti
      Pages 391-410
  7. Surface and Interface Effects

    1. Front Matter
      Pages 411-411
    2. M. Leoni, P. Scardi
      Pages 413-454
    3. R. Birringer, M. Hoffmann, P. Zimmer
      Pages 455-469
  8. Microstructural Gradients; Thin Films

    1. Front Matter
      Pages 471-471
    2. A. Boulle, O. Masson, R. Guinebretière, A. Dauger
      Pages 505-526
    3. M. Golshan, D. Laundy, P. F. Fewster, M. Moore
      Pages 527-539
  9. Back Matter
    Pages 541-553

About this book

Introduction

Diffraction Analysis of the Microstructure of Materials provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves.

Keywords

Diffraction Analysis Dislocation Helium-Atom-Streuung Interface and Surface Effects Powder diffraction Stacking Faults Thin Films X-Ray ceramics crystal diffraction glass modeling physics

Editors and affiliations

  • Eric J. Mittemeijer
    • 1
  • Paolo Scardi
    • 2
  1. 1.Max Planck Institute for Metals ResearchStuttgartGermany
  2. 2.Dipartimento di Ingegneria dei Materiali e Tecnologie IndustrialiUniversità di Trento, Facoltà di IngegneriaMesianoItaly

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-662-06723-9
  • Copyright Information Springer-Verlag Berlin Heidelberg 2004
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-642-07352-6
  • Online ISBN 978-3-662-06723-9
  • Series Print ISSN 0933-033X
  • Series Online ISSN 2196-2812
  • Buy this book on publisher's site