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Measurement of Resistance to CSF Outflow — Clinical Experiences in 333 Patients

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Intracranial Pressure VII

Abstract

Increasing interest in pathological conditions due to possible impairment of CSF reabsorption has prompted a demand for a clinically usable, low risk and not too time-consuming method for measurement of resistance to CSF outflow (Rout).

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References

  • Børgesen SE (1984) Conductance to outflow of CSF in normal pressure hydrocephalus. Acta Neurochir (Wien) 71: 1–45

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  • Børgesen SE, Gjerris F, Sørensen SC (1978) The resistance to outflow of cerebrospinal fluid absorption in normal pressure hydrocephalus. Acta Neurol Scand 57: 88–96

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Authors and Affiliations

  1. University Clinic of Neurosurgery, Rigshospitalet, DK-2100, Copenhagen, Denmark

    S. E. Børgesen, F. Gjerris, O. Fedders, J. F. Schmidt, M. J. Albeck & P. Soelberg-Sørensen

Authors
  1. S. E. Børgesen
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  2. F. Gjerris
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  3. O. Fedders
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  4. J. F. Schmidt
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  5. M. J. Albeck
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  6. P. Soelberg-Sørensen
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Editor information

Editors and Affiliations

  1. Section of Neurosurgery, University of Michigan Hospitals, 1500 E. Medical Center Dr., 48109-0338, Ann Arbor, MI, USA

    Julian T. Hoff MD (Professor of Surgery, Chief) (Professor of Surgery, Chief)

  2. Crosby Laboratories, Section of Neurosurgery, University of Michigan Hospitals, 1500 E. Medical Center Dr., 48109-0338, Ann Arbor, MI, USA

    A. Lorris Betz MD, PhD (Professor of Pediatrics, Neurology, and Surgery, Director) (Professor of Pediatrics, Neurology, and Surgery, Director)

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© 1989 Springer-Verlag Berlin Heidelberg

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Børgesen, S.E., Gjerris, F., Fedders, O., Schmidt, J.F., Albeck, M.J., Soelberg-Sørensen, P. (1989). Measurement of Resistance to CSF Outflow — Clinical Experiences in 333 Patients. In: Hoff, J.T., Betz, A.L. (eds) Intracranial Pressure VII. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-73987-3_95

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  • DOI: https://doi.org/10.1007/978-3-642-73987-3_95

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-642-73989-7

  • Online ISBN: 978-3-642-73987-3

  • eBook Packages: Springer Book Archive

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