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Extended X-Ray Absorption Fine Structure

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Microscopic Methods in Metals

Part of the book series: Topics in Current Physics ((TCPHY,volume 40))

Abstract

The x-ray absorption spectrum of an atom exhibits sharp edges which correspond to the excitation threshold of the core electrons. If the atom is surrounded by other atoms in a condensed phase, then the absorption cross section above the absorption edge is observed to oscillate, exhibiting an often complex structure that can extend for hundreds of electron volts. These oscillations are aptly called the extended x-ray absorption fine structure (EXAFS). The fundamental understanding of EXAFS has advanced in the last two decades to the point where quantitative theoretical formulations can accurately account for the fine structure. The oscillations of the absorption cross section are due to the interference between the outgoing photoelectron wave and the incoming wave that is generated when the photoelectron scatters off of the atoms that surround the excited atom. Hence, EXAFS contains detailed information about the local environment of a particular type of atom. With the theoretical framework providing a relatively simple means of interpretation. EXAFS spectroscopy has developed into an important experimental tool for studying local atomic structure in solids.

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  1. D. G. Stearns
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  2. M. B. Stearns
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  1. Angewandte Physik, Universität des Saarlandes, D-6600, Saarbrücken, Fed. Rep. of Germany

    Ulrich Gonser

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Stearns, D.G., Stearns, M.B. (1986). Extended X-Ray Absorption Fine Structure. In: Gonser, U. (eds) Microscopic Methods in Metals. Topics in Current Physics, vol 40. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-46571-0_6

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  • DOI: https://doi.org/10.1007/978-3-642-46571-0_6

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