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Nanotribology, Nanomechanics, and Materials Characterization

  • Chapter
Springer Handbook of Nanotechnology

Part of the book series: Springer Handbooks ((SHB))

Abstract

Nanotribology and nanomechanics studies are needed to develop a fundamental understanding of interfacial phenomena on a small scale and to study interfacial phenomena in micro-/nanoelectromechanical systems (MEMS/NEMS), magnetic storage devices, and other applications. Friction and wear of lightly loaded micro-/nanocomponents are highly dependent on surface interactions (few atomic layers). These structures are generally coated with molecularly thin films. Nanotribology and nanomechanics studies are also valuable in the fundamental understanding of interfacial phenomena in macrostructures and provide a bridge between science and engineering. An atomic force microscope (AFM) tip is used to simulate a single-asperity contact with a solid or lubricated surface. AFMs are used to study the various tribological phenomena, which include surface roughness, adhesion, friction, scratching, wear, detection of material transfer, and boundary lubrication. In situ surface characterization of local deformation of materials and thin coatings can be carried out using a tensile stage inside an AFM. Mechanical properties such as hardness, Youngʼs modulus of elasticity, and creep/relaxation behavior can be determined on micro- to picoscales using a depth-sensing indentation system in an AFM. Localized surface elasticity and viscoelastic mapping of near-surface regions can be obtained with nanoscale lateral resolution. Finally, an AFM can be used for nanofabrication/nanomachining.

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Abbreviations

A/D:

analog-to-digital

AC:

alternating-current

AC:

amorphous carbon

AFAM:

atomic force acoustic microscopy

AFM:

atomic force microscope

AFM:

atomic force microscopy

BDCS:

biphenyldimethylchlorosilane

BPT:

biphenyl-4-thiol

BPTC:

cross-linked BPT

DC:

direct-current

DI:

deionized

DI:

digital instrument

DLC:

diamondlike carbon

FESP:

force modulation etched Si probe

FFM:

friction force microscope

FFM:

friction force microscopy

HDT:

hexadecanethiol

HOPG:

highly oriented pyrolytic graphite

LB:

Langmuir–Blodgett

LFM:

lateral force microscope

LFM:

lateral force microscopy

ME:

metal-evaporated

MEMS:

microelectromechanical system

MP:

metal particle

MWNT:

multiwall nanotube

NEMS:

nanoelectromechanical system

PECVD:

plasma-enhanced chemical vapor deposition

PET:

poly(ethyleneterephthalate)

PFPE:

perfluoropolyether

PZT:

lead zirconate titanate

RH:

relative humidity

RMS:

root mean square

SAM:

scanning acoustic microscopy

SAM:

self-assembled monolayer

SEM:

scanning electron microscope

SEM:

scanning electron microscopy

SFA:

surface forces apparatus

STM:

scanning tunneling microscope

STM:

scanning tunneling microscopy

TEM:

transmission electron microscope

TEM:

transmission electron microscopy

TESP:

tapping mode etched silicon probe

TM:

tapping mode

TR:

torsional resonance

Z-DOL:

perfluoropolyether

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    Bharat Bhushan

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    Bharat Bhushan

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Bhushan, B. (2010). Nanotribology, Nanomechanics, and Materials Characterization. In: Bhushan, B. (eds) Springer Handbook of Nanotechnology. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-02525-9_28

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