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Applications of aberration-corrected TEM-STEM and high-resolution EELS for the study of functional materials

  • Conference paper
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany

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Abstract

The first applications of high-resolution aberration-corrected microscopy were demonstrated 10 years ago in key publications [1–3] and earlier conferences showing the potential impact of the technique in the study of materials. Aberration-corrected STEM imaging results demonstrating sub-Å resolution were presented soon after [5,6].

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References

  1. Haider, M., Rose, H., Uhlemann, S., Schwan, E., Kabius, B. and Urban, K. (1998) Ultramicroscopy, Vol. 75, pp. 53–60.

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  2. Haider, M., Rose, H., Uhlemann, S., Kabius, B. and Urban, K. (1998) J. of Electron Microscopy, Vol. 47, pp. 395–405.

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  3. Haider, M., Uhlemann, S., Schwan, E., Rose, H., Kabius, B. and Urban, K. (1998) Nature, Vol. 392, pp. 768–769.

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  4. Krivanek, O. L., Dellby, N. and Lupini, A. R., Ultramicroscopy, 78, (1999) 1–11.

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  5. Krivanek, O. L., Nellist, P. D., Dellby, N., Murfitt, M. F. and Szilagyi, Z. Ultramicroscopy, 96, (2003) 229–237.

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  6. We are grateful to J. Preston, R. Hughes, Y. Zhao, B. Gaulin, H. Dabkowska (LBCO sample), M. Robertson, A. Pignolet, O. Gautreau (BLTO sample), J. Etheridge and J.L. Rouviere for providing several valuable samples and for valuable discussions.

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Author information

Authors and Affiliations

  1. Department of Materials Science and Engineering, McMaster University, 1280 Main St. West, Hamilton, L8S 4M1, Canada

    G. A. Botton, C. Maunders, L. Gunawan & K. Cui

  2. Canadian Centre for Electron Microscopy, Brockhouse Institute for Materials Research, McMaster University, 1280 Main St. West, Hamilton, L8S 4M1, Canada

    G. A. Botton, C. Maunders, L. Gunawan, L. Y. Chang & S. Lazar

  3. FEI Company, Acthseweg Noord 5, 5600 KA, Eindhoven, The Netherlands

    S. Lazar

Authors
  1. G. A. Botton
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  2. C. Maunders
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  3. L. Gunawan
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  4. K. Cui
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  5. L. Y. Chang
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  6. S. Lazar
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Editor information

Editors and Affiliations

  1. Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons Institute of Solid State Research, Research Centre Jülich, 52425, Jülich, Germany

    Martina Luysberg  & Karsten Tillmann  & 

  2. Central Facility for Electron Microscopy, RWTH Aachen, Ahornstr. 55, 52074, Aachen, Germany

    Thomas Weirich

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© 2008 Springer-Verlag Berlin Heidelberg

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Botton, G.A., Maunders, C., Gunawan, L., Cui, K., Chang, L.Y., Lazar, S. (2008). Applications of aberration-corrected TEM-STEM and high-resolution EELS for the study of functional materials. In: Luysberg, M., Tillmann, K., Weirich, T. (eds) EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_7

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