EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany

Volume 1: Instrumentation and Methods

  • Martina Luysberg
  • Karsten Tillmann
  • Thomas Weirich

Table of contents

  1. Front Matter
    Pages I-XXXVIII
  2. Instrumentation and Methods

    1. A. L. Bleloch, M. Gass, L. Jiang, B. Mendis, K. Sader, P. Wang
      Pages 1-2
    2. U. Dahmen, R. Erni, C. Kisielowki, V. Radmilovic, Q. Ramasse, A. Schmid et al.
      Pages 3-4
    3. Thomas Schmidt, Helder Marchetto, Rainer Fink, Eberhard Umbach, the SMART collaboration
      Pages 7-8
  3. TEM and STEM instrumentation and Electron Optics

    1. Aberration Correctors

      1. M. Haider, H. Müller, S. Uhlemann, P. Hartel, J. Zach
        Pages 9-10
      2. Ondrej Krivanek, Niklas Dellby, Matt Murfitt, Christopher Own, Zoltan Szilagyi
        Pages 11-12
      3. G. A. Botton, C. Maunders, L. Gunawan, K. Cui, L. Y. Chang, S. Lazar
        Pages 13-14
      4. Pratibha L. Gai, Edward D. Boyes
        Pages 15-16
      5. K. J. Dudeck, N. Benedek, D. J. H. Cockayne
        Pages 17-18
      6. L. Gunawan, R. Nechache, C. Harnagea, A. Pignolet, G. A. Botton
        Pages 25-26
      7. P. Hartel, H. Müller, S. Uhlemann, J. Zach, U. Löbau, R. Höschen et al.
        Pages 27-28
      8. H. Inada, Y. Zhu, J. Wall, V. Volkov, K. Nakamura, M. Konno et al.
        Pages 31-32
      9. H. Inada, J. Wall, Y. Zhu, V. Volkov, K. Nakamura, M. Konno et al.
        Pages 33-34

About these proceedings

Introduction

Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008.

Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world.

The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.

Keywords

calculus electron electron microscopy electron optics microscopy optics scanning electron microscopy

Editors and affiliations

  • Martina Luysberg
    • 1
  • Karsten Tillmann
    • 1
  • Thomas Weirich
    • 2
  1. 1.Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons Institute of Solid State ResearchResearch Centre JülichJülichGermany
  2. 2.Central Facility for Electron MicroscopyRWTH AachenAachenGermany

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-540-85156-1
  • Copyright Information Springer-Verlag Berlin Heidelberg 2008
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-540-85154-7
  • Online ISBN 978-3-540-85156-1
  • About this book