EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany

Volume 1: Instrumentation and Methods

  • Martina Luysberg
  • Karsten Tillmann
  • Thomas Weirich

Table of contents

  1. Front Matter
    Pages I-XXXVIII
  2. Instrumentation and Methods

    1. A. L. Bleloch, M. Gass, L. Jiang, B. Mendis, K. Sader, P. Wang
      Pages 1-2
    2. U. Dahmen, R. Erni, C. Kisielowki, V. Radmilovic, Q. Ramasse, A. Schmid et al.
      Pages 3-4
    3. Thomas Schmidt, Helder Marchetto, Rainer Fink, Eberhard Umbach, the SMART collaboration
      Pages 7-8
  3. TEM and STEM instrumentation and Electron Optics

    1. Aberration Correctors

      1. M. Haider, H. Müller, S. Uhlemann, P. Hartel, J. Zach
        Pages 9-10
      2. Ondrej Krivanek, Niklas Dellby, Matt Murfitt, Christopher Own, Zoltan Szilagyi
        Pages 11-12
      3. G. A. Botton, C. Maunders, L. Gunawan, K. Cui, L. Y. Chang, S. Lazar
        Pages 13-14
      4. Pratibha L. Gai, Edward D. Boyes
        Pages 15-16
      5. K. J. Dudeck, N. Benedek, D. J. H. Cockayne
        Pages 17-18
      6. L. Gunawan, R. Nechache, C. Harnagea, A. Pignolet, G. A. Botton
        Pages 25-26
      7. P. Hartel, H. Müller, S. Uhlemann, J. Zach, U. Löbau, R. Höschen et al.
        Pages 27-28
      8. H. Inada, Y. Zhu, J. Wall, V. Volkov, K. Nakamura, M. Konno et al.
        Pages 31-32
      9. H. Inada, J. Wall, Y. Zhu, V. Volkov, K. Nakamura, M. Konno et al.
        Pages 33-34
      10. P. D. Nellist, E. C. Cosgriff, G. Behan, A. I. Kirkland, A. J. D’Alfonso, S. D. Findlay et al.
        Pages 39-40
      11. E. Okunishi, Y. Kondo, H. Sawada, N. Endo, A. Yasuhara, H. Endo et al.
        Pages 43-44
      12. Q. M. Ramasse, N. L. Okamoto, D. Morgan, D. Neiner, C. L. Condron, J. Wang et al.
        Pages 45-46
      13. H. Sawada, F. Hosokawa, T. Kaneyama, T. Tomita, Y. Kondo, T. Tanaka et al.
        Pages 47-48
    2. Filters, Spectrometers, Monochromators and Sources

      1. E. Essers, D. Mittmann, T. Mandler, G. Benner
        Pages 51-52
      2. P. C. Tiemeijer, M. Bischoff, B. Freitag, C. Kisielowski
        Pages 53-54
      3. B. Freitag, G Knippels, S. Kujawa, P. C. Tiemeijer, M. Van der Stam, D. Hubert et al.
        Pages 55-56
      4. U. Luecken, P. Tiemeijer, M. Barfels, P. Mooney, B. Bailey, D. Agard
        Pages 57-58
      5. C. Rochow, T. Ohnweiler, E. Plies
        Pages 63-64
    3. Phase Plates and Detectors

      1. R. R. Schröder, B. Barton, K. Schultheiß, B. Gamm, D. Gerthsen
        Pages 69-70
      2. R. Henderson, G. McMullan, S. Chen, A. R. Faruqi
        Pages 71-72
      3. G. McMullan, A. R. Faruqi, R. Henderson, N. Guerrini, R. Turchetta, A. Jacobs et al.
        Pages 73-74
      4. M. Dries, K. Schultheiß, B. Gamm, H. Störmer, D. Gerthsen, B. Barton et al.
        Pages 79-80
      5. M. Matijevic, S. Lengweiler, D. Preikszas, H. Müller, R. R. Schröder, G. Benner
        Pages 83-84
      6. G. Moldovan, X. Li, P. Wilshaw, A. I. Kirkland
        Pages 85-86
      7. D. Tietz, H. Tietz, S. Nickell, W. Baumeister, J. M. Plitzko
        Pages 89-90
      8. Alexander Ziegler, Robert Hartmann, Robert Andritschke, Florian Schopper, Lothar Strüder, Heike Soltau et al.
        Pages 91-92
  4. TEM and STEM methods

    1. Quantitative HRTEM and STEM

About these proceedings


Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008.

Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world.

The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science.


calculus electron electron microscopy electron optics microscopy optics scanning electron microscopy

Editors and affiliations

  • Martina Luysberg
    • 1
  • Karsten Tillmann
    • 1
  • Thomas Weirich
    • 2
  1. 1.Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons Institute of Solid State ResearchResearch Centre JülichJülichGermany
  2. 2.Central Facility for Electron MicroscopyRWTH AachenAachenGermany

Bibliographic information

  • DOI
  • Copyright Information Springer-Verlag Berlin Heidelberg 2008
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-540-85154-7
  • Online ISBN 978-3-540-85156-1
  • Buy this book on publisher's site