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Fundamentals of Inelastic Light Scattering in Semiconductors and Insulators

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Light Scattering in Solids

Part of the book series: Topics in Applied Physics ((TAP,volume 8))

Abstract

During the past ten years inelastic light scattering spectroscopy has developed into one of the most powerful and most widely used optical techniques for the study of the properties of the low frequency elementary excitations of solids. This has been, to some extent, a consequence of the availability of lasers as excitation sources and of improved spectrometers and associated electronics for recording weak light scattering spectra. Scattering by elementary excitations has been observed in opaque solids, including metals and narrow gap semiconductors, as well as in transparent crystals. Very recently, with the help of computerized spectra recording techniques it has become possible to observe extremely weak scattering intensities.

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Authors
  1. A. Pinczuk
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  2. E. Burstein
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Editors and Affiliations

  1. Max-Planck-Institut für Festkörperforschung, D-7000, Stuttgart 80, Fed. Rep. of Germany

    Manuel Cardona

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Pinczuk, A., Burstein, E. (1975). Fundamentals of Inelastic Light Scattering in Semiconductors and Insulators. In: Cardona, M. (eds) Light Scattering in Solids. Topics in Applied Physics, vol 8. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-37568-5_2

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  • DOI: https://doi.org/10.1007/978-3-540-37568-5_2

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-662-22095-5

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