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Friction and Wear on the Atomic Scale

  • Reference work entry
Springer Handbook of Nanotechnology

Part of the book series: Springer Handbooks ((SHB))

Abstract

Friction has long been the subject of research: the empirical da Vinci–Amontons friction laws have been common knowledge for centuries. Macroscopic experiments performed by the school of Bowden and Tabor revealed that macroscopic friction can be related to the collective action of small asperities. Over the last 15 years, experiments performed with the atomic force microscope have provided new insights into the physics of single asperities sliding over surfaces. This development, together with the results from complementary experiments using surface force apparatus and the quartz microbalance, have led to the new field of nanotribology. At the same time, increasing computing power has permitted the simulation of processes that occur during sliding contact involving several hundreds of atoms. It has become clear that atomic processes cannot be neglected when interpreting nanotribology experiments. Even on well-defined surfaces, experiments have revealed that atomic structure is directly linked to friction force. This chapter will describe friction force microscopy experiments that reveal, more or less directly, atomic processes during sliding contact.

We will begin by introducing friction force microscopy, including the calibration of cantilever force sensors and special aspects of the ultrahigh vacuum environment. The empirical Tomlinson model often used to describe atomic stick-slip results is therefore presented in detail. We review experimental results regarding atomic friction, including thermal activation, velocity dependence and temperature dependence. The geometry of the contact is crucial to the interpretation of experimental results, such as the calculation of the lateral contact stiffness, as we shall see. The onset of wear on the atomic scale has recently been sudied experimentally and it is described here. In order to compare results, we present molecular dynamics simulations that are directly related to atomic friction experiments. The chapter ends with a discussion of dissipation measurements performed in noncontact force microscopy, which may become an important complementary tool for the study of mechanical dissipation in nanoscopic devices.

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Abbreviations

AFM:

atomic force microscopy

DMT:

Derjaguin–Muller–Toporov

FFM:

friction force microscope

FKT:

Frenkel–Kontorova–Tomlinson

JKR:

Johnson–Kendall–Roberts

LFM:

lateral force microscopy

MD:

molecular dynamics

PTFE:

polytetrafluoroethylene

SEM:

scanning electron microscopy

UHV:

ultrahigh vacuum

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Authors and Affiliations

  1. Department of Physics, University of Basel, Klingelbergstraße 82, 4056, Basel, Switzerland

    Enrico Gnecco Dr.

  2. Physics Department, McGill University, 3600 rue University, H3A 2T8, Montreal, QC, Canada

    Roland Bennewitz Dr.

  3. Institute of Physics, University of Basel, Klingelbergstraß 82, 4056, Basel, Switzerland

    Oliver Pfeiffer

  4. Institute of Physics, University of Basel, Klingelbergstraße 82, 4056, Basel, Switzerland

    Anisoara Socoliuc

  5. Institute of Physics, University of Basel, Klingelbergstraße 82, 4056, Basel, Switzerland

    Ernst Meyer Prof.

Authors
  1. Enrico Gnecco Dr.
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  2. Roland Bennewitz Dr.
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  3. Oliver Pfeiffer
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  4. Anisoara Socoliuc
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  5. Ernst Meyer Prof.
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Corresponding authors

Correspondence to Enrico Gnecco Dr. , Roland Bennewitz Dr. , Oliver Pfeiffer , Anisoara Socoliuc or Ernst Meyer Prof. .

Editor information

Editors and Affiliations

  1. Nanotribology Laboratory for Information Storage and MEMS/NEMS (NLIM), Ohio State University, 201 W. 19th Avenue, W 390 Scott Laboratory, Ohio 43210-1142, Columbus, OH, USA

    Bharat Bhushan Prof.

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© 2007 Springer-Verlag

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Gnecco, E., Bennewitz, R., Pfeiffer, O., Socoliuc, A., Meyer, E. (2007). Friction and Wear on the Atomic Scale. In: Bhushan, B. (eds) Springer Handbook of Nanotechnology. Springer Handbooks. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-29857-1_33

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