Abstract
The chapter deeply analyzes the pseudo-exhaustive tests based on march tests. The main advantage of pseudo-exhaustive testing is its high fault coverage and lower complexity compared with exhaustive testing. The investigation is based on the idea of orbits defined as sets of patterns received as a result of the run of march tests with one read and one write operation. The problem of pseudo-exhaustive tests based on multi-run memory testing with background changing and/or address order variation is regarded as the coupon-collector’s problem which is a classical problem in combinatorial probability. Finally, the complexity of pseudo-exhaustive tests formed on the reordering of address sequences and tests based on background changing is compared.
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Mrozek, I. (2019). Pseudo-Exhaustive Testing Based on March Tests. In: Multi-run Memory Tests for Pattern Sensitive Faults. Springer, Cham. https://doi.org/10.1007/978-3-319-91204-2_8
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DOI: https://doi.org/10.1007/978-3-319-91204-2_8
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