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Basics of Functional RAM Testing

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Multi-run Memory Tests for Pattern Sensitive Faults

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Abstract

The chapter presents an introduction to deterministic functional RAM testing. The memory chip model is given, and a set of traditional functional fault models (FFM) as well as basic march tests are discussed.

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Authors and Affiliations

  1. Bialystok University of Technology, Bialystok, Poland

    Ireneusz Mrozek

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  1. Ireneusz Mrozek
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Mrozek, I. (2019). Basics of Functional RAM Testing. In: Multi-run Memory Tests for Pattern Sensitive Faults. Springer, Cham. https://doi.org/10.1007/978-3-319-91204-2_2

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  • DOI: https://doi.org/10.1007/978-3-319-91204-2_2

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-91203-5

  • Online ISBN: 978-3-319-91204-2

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