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X-Ray and EELS Imaging

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Author information

Authors and Affiliations

  1. Materials Characterization Department, Sandia National Laboratories, Albuquerque, USA

    Paul Kotula

Authors
  1. Paul Kotula
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Corresponding author

Correspondence to Paul Kotula .

Editor information

Editors and Affiliations

  1. University of Connecticut, Storrs, Connecticut, USA

    C. Barry Carter

  2. Ohio State University, Columbus, Ohio, USA

    David B. Williams

Appendix

Appendix

16.1.1 People

Peter Duncumb joined the Tube Investments Lab in 1959 and is credited with first converting the TEM into an AEM by adding a spectrometer – the new instrument was called EMMA.

John J. Friel died aged 70 on February 17, 2015, after slipping on ice. He was a pioneer in bringing modern spectral imaging to the microanalysis community.

16.1.2 Self-Assessment Questions

In setting up for an XEDS spectral image we have an instantaneous count rate from our sample of 3000 counts per second. How long do we have to acquire data from each pixel (total per pixel dwell time) to get 100 counts per spectrum?

16.1.3 Text-Specific Questions

Why can we event-stream or make multiple passes to collect XEDS-SI data but not for an EELS-SI?

We’re setting up for an EELS-SI and notice that we are saturating the detector. Aside from decreasing the dwell time, what else can we do to decrease our signal on the detector without changing the detector collection angle?

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Kotula, P. (2016). X-Ray and EELS Imaging. In: Carter, C., Williams, D. (eds) Transmission Electron Microscopy. Springer, Cham. https://doi.org/10.1007/978-3-319-26651-0_16

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