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AFM Imaging Control and System Integration

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Active Probe Atomic Force Microscopy

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Abstract

The development of an atomic force microscopy (AFM) system requires a comprehensive understanding of mechatronics and instrumentation. This chapter focuses on integrating the AFM system with additional modules and control strategies for AFM imaging, building upon the subsystems introduced in previous chapters. The control algorithms necessary for AFM imaging are discussed, covering both low-level control for scanner axis motion and high-level control for overall AFM imaging. Furthermore, the chapter discusses additional modules for AFM system integration, including the optical microscope, the imaging environment control chamber, and the image post-processing software. The chapter also provides a brief overview of specialized imaging modes beyond topography imaging. Finally, an example of a modular AFM system design capable of working with both passive and active probes is presented.

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Authors and Affiliations

  1. Mechanical Engineering Department, Physics Department, Massachusetts Institute of Technology, Cambridge, MA, USA

    Fangzhou Xia

  2. Production and Precision Metrology, Ilmenau University of Technology, Ilmenau, Germany

    Ivo W. Rangelow

  3. Mechanical Engineering Department, Massachusetts Institute of Technology, Cambridge, MA, USA

    Kamal Youcef-Toumi

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  1. Fangzhou Xia
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  2. Ivo W. Rangelow
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  3. Kamal Youcef-Toumi
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Xia, F., Rangelow, I.W., Youcef-Toumi, K. (2024). AFM Imaging Control and System Integration. In: Active Probe Atomic Force Microscopy. Springer, Cham. https://doi.org/10.1007/978-3-031-44233-9_9

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