Abstract
High-performance electronics and advanced signal processing algorithms are crucial for optimal atomic force microscope (AFM) imaging. These elements work together to support the operation of nano-positioning systems and cantilever probes, ultimately enabling the production of images with sub-nanometer resolution. In this chapter, the principles of high-bandwidth power amplifiers, signal conditioning electronics, and data acquisition systems are covered, primarily focusing on their role in the operation of nano-positioners.
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Xia, F., Rangelow, I.W., Youcef-Toumi, K. (2024). AFM Electronics and Signal Processing. In: Active Probe Atomic Force Microscopy. Springer, Cham. https://doi.org/10.1007/978-3-031-44233-9_8
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DOI: https://doi.org/10.1007/978-3-031-44233-9_8
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