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Introduction to Atomic Force Microscopy

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Active Probe Atomic Force Microscopy

Abstract

This chapter provides an overview of the atomic force microscope (AFM) system. It begins with a broad discussion on a list of tools available for imaging at micro-/nanoscale. Subsequently, the book’s scope, objectives, and chapter topics are outlined. The discussion centers around the operational principles and imaging capabilities of AFMs without going into specific implementation details. Fundamental aspects such as modes of operation, probe-sample interactions, experimental procedures, and data analysis are explored. This knowledge base lays a solid foundation for the readers to design experiments, capture AFM images, and interpret the results.

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Author information

Authors and Affiliations

  1. Mechanical Engineering Department, Physics Department, Massachusetts Institute of Technology, Cambridge, MA, USA

    Fangzhou Xia

  2. Production and Precision Metrology, Ilmenau University of Technology, Ilmenau, Germany

    Ivo W. Rangelow

  3. Mechanical Engineering Department, Massachusetts Institute of Technology, Cambridge, MA, USA

    Kamal Youcef-Toumi

Authors
  1. Fangzhou Xia
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  2. Ivo W. Rangelow
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  3. Kamal Youcef-Toumi
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Xia, F., Rangelow, I.W., Youcef-Toumi, K. (2024). Introduction to Atomic Force Microscopy. In: Active Probe Atomic Force Microscopy. Springer, Cham. https://doi.org/10.1007/978-3-031-44233-9_1

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