Abstract
The main part of this book was completed in the spring of 1991. Science, like time, does not stand still, and in the past six months new data and information has appeared which warrants consideration and inclusion in this book. Although this additional information does not change the causa causans or the basic premises on which the book is based, it does provide new insights into the theory and practice of low-temperature microscopy and analysis. It is intended only to discuss these new insights and not to consider the now burgeoning literature which describe the use of many of the established low-temperature methods and techniques described in the earlier chapters. For the reader’s convenience, this updated material will be discussed in the order it appears in the book.
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© 1992 Springer Science+Business Media New York
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Echlin, P. (1992). Current Status of Low-Temperature Microscopy and Analysis. In: Low-Temperature Microscopy and Analysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-2302-8_12
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DOI: https://doi.org/10.1007/978-1-4899-2302-8_12
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4899-2304-2
Online ISBN: 978-1-4899-2302-8
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