Abstract
In this review, I will outline our recent work on the thermal and x-ray production of spin active point defects in vitreous (v-) SiO2. Experimental details and more extensive comments on the nature of the defects and the relevant work of others will be found in Refs. 1–15.
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Galeener, F.L. (1993). Thermal and X-Ray Production of Point Defects in Vitreous SiO2 . In: Helms, C.R., Deal, B.E. (eds) The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-1588-7_14
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DOI: https://doi.org/10.1007/978-1-4899-1588-7_14
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