Abstract
We present the basics of multiple importance sampling (MIS), a well-known algorithm that can lower the amount of noise in a path tracer significantly by combining multiple sampling strategies. We introduce MIS in the context of direct light sampling and show how it works in a path tracer. We assume that the reader has already written a simple path tracer and wants to improve it.
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Lindqvist, A. (2021). Multiple Importance Sampling 101. In: Marrs, A., Shirley, P., Wald, I. (eds) Ray Tracing Gems II. Apress, Berkeley, CA. https://doi.org/10.1007/978-1-4842-7185-8_20
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DOI: https://doi.org/10.1007/978-1-4842-7185-8_20
Publisher Name: Apress, Berkeley, CA
Print ISBN: 978-1-4842-7184-1
Online ISBN: 978-1-4842-7185-8
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