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Ultrafast Transport Measurements in Bulk Semiconductors and Tunneling Devices Using Electro-Optic Sampling

  • Kevin E. Meyer
Part of the NATO ASI Series book series (NSSB, volume 206)

Abstract

Electro-optic sampling (EOS) is a technique which has been developed for measuring transient electrical fields with subpicosecond resolution. It takes advantage of the inherent speed of the linear electro-optic effect (Pockels effect) to convert a fast electrical transient into a fast optical transient. The optical transient is then probed using the conventional pump/probe approach in conjunction with a short-pulse dye laser. Two applications of this technique will be discussed which are relevant to the study of transport physics on small time and dimension scales.

Keywords

Transmission Line Probe Beam Resonant Tunneling Diode Tunneling Time Velocity Overshoot 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1989

Authors and Affiliations

  • Kevin E. Meyer
    • 1
  1. 1.Cavendish LaboratoryUniversity of CambridgeCambridgeEngland

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