Spectroscopy of Semiconductor Microstructures

  • Gerhard Fasol
  • Annalisa Fasolino
  • Paolo Lugli

Part of the NATO ASI Series book series (NSSB, volume 206)

Table of contents

  1. Front Matter
    Pages i-xiv
  2. Growth of Semiconductor Microstructures

  3. Quantum Wires and Quantum Dots

    1. T. Demel, D. Heitmann, P. Grambow
      Pages 75-87
    2. U. Merkt, Ch. Sikorski, J. Alsmeier
      Pages 89-114
    3. D. A. Wharam, M. Pepper, R. Newbury, D. G. Hasko, H. Ahmed, J. E. F. Frost et al.
      Pages 115-141
  4. Phonons in III-V, Si / Ge and Fibonacci Superlattices

    1. Manuel Cardona
      Pages 143-155
    2. J. Menéndez, A. Pinczuk, J. P. Valladares, L. N. Pfeiffer, K. W. West, A. C. Gossard et al.
      Pages 157-164
    3. G. Abstreiter, K. Eberl, E. Friess, U. Menczigar, W. Wegscheider, R. Zachai
      Pages 165-174
    4. E. Molinari, A. Fasolino
      Pages 195-205
    5. D. Paquet, M. C. Joncour, B. Jusserand, F. Laruelle, F. Mollot, B. Etienne
      Pages 223-234
    6. T. A. Gant, D. J. Lockwood, J.-M. Baribeau, A. H. MacDonald
      Pages 235-249
  5. Optical Probing of Band States and Wavefunctions

    1. Stefano Baroni, Raffaele Resta, Alfonso Baldereschi, Maria Peressi
      Pages 251-271
    2. Marie-Helene Meynadier
      Pages 293-304
    3. Jean-Yves Marzin, Jean Michel Gérard
      Pages 305-316

About this book

Keywords

Absorption Dispersion Energie exciton nonlinear optics optical properties optics semiconductor simulation spectroscopy

Editors and affiliations

  • Gerhard Fasol
    • 1
  • Annalisa Fasolino
    • 2
  • Paolo Lugli
    • 3
  1. 1.University of CambridgeCambridgeUK
  2. 2.International School for Advanced Studies (SISSA)TriesteItaly
  3. 3.University of Rome IIRomeItaly

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4757-6565-6
  • Copyright Information Springer-Verlag US 1989
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4757-6567-0
  • Online ISBN 978-1-4757-6565-6
  • Series Print ISSN 0258-1221
  • About this book