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On-Line Testing for VLSI

  • Michael Nicolaidis
  • Yervan Zorian
  • Dhiraj K. Pradan

Part of the Frontiers in Electronic Testing book series (FRET, volume 11)

Table of contents

  1. Front Matter
    Pages 1-5
  2. Introduction

    1. M. Nicolaidis, Y. Zorian
      Pages 7-20
  3. Self-Checking Design

    1. J. J. Stiffler
      Pages 21-27
    2. Ricardo O. Duarte, M. Nicolaidis, H. Bederr, Y. Zorian
      Pages 29-39
    3. V. V. Saposhnikov, A. Morosov, VL. V. Saposhnikov, M. Gössel
      Pages 41-53
    4. Antonis Paschalis, Dimitris Gizopoulos, Nikolaos Gaitanis
      Pages 55-61
  4. Self Checking Checkers

  5. On-Line Monitoring of Reliability Indicators

    1. V. Székely, M. Rencz, J. M. Karam, M. Lubaszewski, B. Courtois
      Pages 81-92
    2. E. Garcia-Moreno, B. Iñiguez, M. Roca, J. Segura, E. Isern
      Pages 101-110
  6. Built-In Self-Test

    1. Hussain Al-Asaad, John P. Hayes, Brian T. Murray
      Pages 111-125
    2. Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig
      Pages 127-138
    3. Piero Olivo, Marcello Dalpasso
      Pages 139-144
  7. Fault Tolerant Systems

  8. Back Matter
    Pages 161-161

About this book

Introduction

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Keywords

ASIC CMOS Hardware Sensor VLSI communication integrated circuit single-electron transistor

Editors and affiliations

  • Michael Nicolaidis
    • 1
  • Yervan Zorian
    • 2
  • Dhiraj K. Pradan
    • 3
  1. 1.TIMA LaboratoriesUSA
  2. 2.Logic Vision, Inc.USA
  3. 3.Texas A & M UniversityUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-1-4757-6069-9
  • Copyright Information Springer-Verlag US 1998
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4419-5033-8
  • Online ISBN 978-1-4757-6069-9
  • Series Print ISSN 0929-1296
  • Buy this book on publisher's site