Abstract
Experiment 7.1: Setting Beam Current and Focusing Beam. From either Figure A2.5 of Laboratory 2 or Figure 2.16a of SEMXM, a 30-nA beam may be estimated to be about 200 nm in diameter. The condenser lens controls the beam current available at the specimen, while the focus of the electron beam on the specimen is controlled by the objective lens.
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© 1990 Plenum Press, New York
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Lyman, C.E. et al. (1990). Wavelength-Dispersive X-Ray Spectrometry and Microanalysis. In: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-0635-1_36
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DOI: https://doi.org/10.1007/978-1-4613-0635-1_36
Publisher Name: Springer, Boston, MA
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