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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

A Laboratory Workbook

  • Book
  • © 1990

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Table of contents (56 chapters)

  1. Scanning Electron Microscopy and X-Ray Microanalysis

  2. Advanced Scanning Electron Microscopy

Keywords

About this book

During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.

Authors and Affiliations

  • Lehigh University, Bethlehem, USA

    Charles E. Lyman, Joseph I. Goldstein, David B. Williams

  • Sandia National Laboratories, Albuquerque, USA

    Alton D. Romig

  • University of Cambridge, Cambridge, England

    Patrick Echlin

  • University of Tennessee, Knoxville, USA

    David C. Joy

  • National Institute of Standards and Technology, Gaithersburg, USA

    Dale E. Newbury, Charles E. Fiori

  • California Institute of Technology, Pasadena, USA

    John T. Armstrong

  • GE Corporate Research and Development, Schenectady, USA

    Eric Lifshin

  • The University of Connecticut Health Center, Farmington, USA

    Klaus-Ruediger Peters

Bibliographic Information

  • Book Title: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

  • Book Subtitle: A Laboratory Workbook

  • Authors: Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig, Patrick Echlin, David C. Joy, Dale E. Newbury, David B. Williams, John T. Armstrong, Charles E. Fiori, Eric Lifshin, Klaus-Ruediger Peters

  • DOI: https://doi.org/10.1007/978-1-4613-0635-1

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Plenum Press, New York 1990

  • Softcover ISBN: 978-0-306-43591-1Published: 31 August 1990

  • eBook ISBN: 978-1-4613-0635-1Published: 06 December 2012

  • Edition Number: 1

  • Number of Pages: XI, 407

  • Topics: Developmental Biology, Characterization and Evaluation of Materials

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