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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy

A Laboratory Workbook

  • Charles E. Lyman
  • Joseph I. Goldstein
  • Alton D. RomigJr.
  • Patrick Echlin
  • David C. Joy
  • Dale E. Newbury
  • David B. Williams
  • John T. Armstrong
  • Charles E. Fiori
  • Eric Lifshin
  • Klaus-Ruediger Peters

Table of contents

  1. Front Matter
    Pages i-xi
  2. Scanning Electron Microscopy and X-Ray Microanalysis

    1. Front Matter
      Pages 1-1
    2. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 3-7
    3. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 8-15
    4. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 16-21
    5. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 22-26
    6. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 27-32
    7. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 33-41
    8. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 42-47
  3. Advanced Scanning Electron Microscopy

    1. Front Matter
      Pages 49-49
    2. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 51-54
    3. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 55-56
    4. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 57-60
    5. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 61-66
    6. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 67-72
    7. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 73-77
    8. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 78-80
    9. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 81-85
    10. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 86-89
    11. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 90-95
  4. Advanced X-Ray Microanalysis

    1. Front Matter
      Pages 97-97
    2. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 99-107
    3. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 108-116
    4. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 117-121
    5. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 122-126
    6. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 127-131
    7. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 132-136
  5. Analytical Electron Microscopy

    1. Front Matter
      Pages 137-137
    2. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 139-142
    3. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 143-147
    4. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 148-152
    5. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 153-156
  6. Guide to Specimen Preparation

    1. Front Matter
      Pages 157-157
    2. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 159-171
    3. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 172-179
    4. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 180-186
  7. Scanning Electron Microscopy and X-Ray Microanalysis

    1. Front Matter
      Pages 187-187
    2. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 189-196
    3. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 197-203
    4. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 204-206
    5. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 207-212
    6. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 213-218
    7. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 219-223
  8. Advanced Scanning Electron Microscopy

    1. Front Matter
      Pages 225-225
    2. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 227-231
    3. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 232-233
    4. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 234-241
    5. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 242-250
    6. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 251-262
    7. Charles E. Lyman, Joseph I. Goldstein, Alton D. Romig Jr., Patrick Echlin, David C. Joy, Dale E. Newbury et al.
      Pages 263-274

About this book

Introduction

During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for instructors to devise meaningful experiments. The present workbook provides a series of fundamental experiments to aid in "hands-on" learning of the use of the instrumentation and the techniques. It is written by a group of eminently qualified scientists and educators. The importance of hands-on learning cannot be overemphasized.

Keywords

X-ray development electron microscopy microscopy

Authors and affiliations

  • Charles E. Lyman
    • 1
  • Joseph I. Goldstein
    • 1
  • Alton D. RomigJr.
    • 2
  • Patrick Echlin
    • 3
  • David C. Joy
    • 4
  • Dale E. Newbury
    • 5
  • David B. Williams
    • 1
  • John T. Armstrong
    • 6
  • Charles E. Fiori
    • 5
  • Eric Lifshin
    • 7
  • Klaus-Ruediger Peters
    • 8
  1. 1.Lehigh UniversityBethlehemUSA
  2. 2.Sandia National LaboratoriesAlbuquerqueUSA
  3. 3.University of CambridgeCambridgeEngland
  4. 4.University of TennesseeKnoxvilleUSA
  5. 5.National Institute of Standards and TechnologyGaithersburgUSA
  6. 6.California Institute of TechnologyPasadenaUSA
  7. 7.GE Corporate Research and DevelopmentSchenectadyUSA
  8. 8.The University of Connecticut Health CenterFarmingtonUSA

Bibliographic information