Abstract
The second volume of the “Sample Preparation Handbook for Transmission Electron Microscopy” contains descriptions of 14 preliminary and/or complementary sample preparation techniques and 21 thin slice preparation techniques for the transmission electron microscope (TEM).
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Ayache, J., Beaunier, L., Boumendil, J., Ehret, G., Laub, D. (2010). Techniques: General Introduction. In: Sample Preparation Handbook for Transmission Electron Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-1-4419-5975-1_1
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DOI: https://doi.org/10.1007/978-1-4419-5975-1_1
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Online ISBN: 978-1-4419-5975-1
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