Abstract
Long-term reliability of processors is experiencing growing attention since decreasing feature sizes and increasing power consumption have a negative influence on the lifespan. The reliability can also be influenced by Dynamic Power Management (DPM), since it affects the processor’s temperature.
In this paper, it is examined how different DPM-strategies for Multi- Core processors alter their lifespan. By simulating such a Multi-Core system using the Self Distributing Virtual Machine (SDVM), thus exploiting dynamic parallelism, it is shown that its long-term reliability can be influenced actively with different DPM strategies.
Parts of this work have been supported by the Deutsche Forschungsgemeinschaft (DFG).
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REFERENCES
ITRS, “Critical reliability challenges for the international technology roadmap for semiconductors,” 2003, international Sematech Technology Transfer document 03024377A-TR.
J. Srinivasan, S. V. Adve, P. Bose, J. Rivers, and C.-K. Hu, “Ramp: A model for reliability aware microprocessor design,” in IBM Research Report, RC23048 (W0312-122), Dec. 2003.
J. Srinivasan and et al., “The case for lifetime reliability-aware microprocessors,” in Proc. of the 31st Annual Intl. Symp. on Comp. Architecture, 2004.
K. Mihic, T. Simunic, and G. D. Micheli, “Reliability and power management of integrated systems,” in DSD-Euromicro Symposium on Digital System Design, 2004, pp. 5–11.
JEDEC, “Failure mechanisms and models for semiconductor devices,” 2003, jEDEC Publication JEP122-B, Jedec Solid State Technolgy Association.
J. Haase, F. Eschmann, B. Klauer, and K. Waldschmidt, “The SDVM: A Self Distributing Virtual Machine,” in Organic and Pervasive Computing ARCS 2004: International Conference on Architecture of Computing Systems, ser. Lecture Notes in Computer Science, vol. 2981. Heidelberg: Springer Verlag, 2004.
Intel, “Pentium M Processor Datasheet,” Apr. 2004, http://www.intel.com/ design/mobile/datashts/252612.htm.
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© 2006 International Federation for Information Processing
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Haase, J., Damm, M., Hauser, D., Waldschmidt, K. (2006). Reliability-Aware Power Management of Multi-Core Processors. In: Kleinjohann, B., Kleinjohann, L., Machado, R.J., Pereira, C.E., Thiagarajan, P.S. (eds) From Model-Driven Design to Resource Management for Distributed Embedded Systems. DIPES 2006. IFIP International Federation for Information Processing, vol 225. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-39362-9_22
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DOI: https://doi.org/10.1007/978-0-387-39362-9_22
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