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Iberoamerican Congress on Pattern Recognition

CIARP 2005: Progress in Pattern Recognition, Image Analysis and Applications pp 880–890Cite as

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Tool-Wear Monitoring Based on Continuous Hidden Markov Models

Tool-Wear Monitoring Based on Continuous Hidden Markov Models

  • Antonio G. Vallejo Jr.18,
  • Juan A. Nolazco-Flores19,
  • Rubén Morales-Menéndez19,
  • L. Enrique Sucar20 &
  • …
  • Ciro A. Rodríguez19 
  • Conference paper
  • 998 Accesses

  • 13 Citations

Part of the Lecture Notes in Computer Science book series (LNIP,volume 3773)

Abstract

In this work we propose to monitor the cutting tool-wear condition in a CNC-machining center by using continuous Hidden Markov Models (HMM). A database was built with the vibration signals obtained during the machining process. The workpiece used in the milling process was aluminum 6061. Cutting tests were performed on a Huron milling machine equipped with a Sinumerik 840D open CNC. We trained/tested the HMM under 18 different operating conditions. We identified three key transitions in the signals. First, the cutting tool touches the workpiece. Second, a stable waveform is observed when the tool is in contact with the workpiece. Third, the tool finishes the milling process. Considering these transitions, we use a five-state HMM for modeling the process. The HMMs are created by preprocessing the waveforms, followed by training step using Baum-Welch algorithm. In the recognition process, the signal waveform is also preprocessed, then the trained HMM are used for decoding. Early experimental results validate our proposal in exploiting speech recognition frameworks in monitoring machining centers. The classifier was capable of detecting the cutting tool condition within large variations of spindle speed and feed rate, and accuracy of 84.19%.

Keywords

  • Signal Processing and Analysis
  • Remote Sensing Applications of Pattern Recognition
  • Hidden Markov Models
  • Tool-wear monitoring

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Author information

Authors and Affiliations

  1. ITESM Laguna Campus, Mechatronic Dept., Torreón, Coah., México

    Antonio G. Vallejo Jr.

  2. ITESM Monterrey Campus, Monterrey, NL, México

    Juan A. Nolazco-Flores, Rubén Morales-Menéndez & Ciro A. Rodríguez

  3. ITESM Morelos Campus, Cuernavaca, Mor, México

    L. Enrique Sucar

Authors
  1. Antonio G. Vallejo Jr.
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  2. Juan A. Nolazco-Flores
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  3. Rubén Morales-Menéndez
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  4. L. Enrique Sucar
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  5. Ciro A. Rodríguez
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Editor information

Editors and Affiliations

  1. Dept. System Engineering and Automation, Universitat Politècnica de Catalunya (UPC) Barcelona, Spain

    Alberto Sanfeliu

  2. Pattern Recognition Group, ICIMAF, Havana, Cuba

    Manuel Lazo Cortés

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© 2005 Springer-Verlag Berlin Heidelberg

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Vallejo, A.G., Nolazco-Flores, J.A., Morales-Menéndez, R., Sucar, L.E., Rodríguez, C.A. (2005). Tool-Wear Monitoring Based on Continuous Hidden Markov Models. In: Sanfeliu, A., Cortés, M.L. (eds) Progress in Pattern Recognition, Image Analysis and Applications. CIARP 2005. Lecture Notes in Computer Science, vol 3773. Springer, Berlin, Heidelberg. https://doi.org/10.1007/11578079_91

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  • DOI: https://doi.org/10.1007/11578079_91

  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-29850-2

  • Online ISBN: 978-3-540-32242-9

  • eBook Packages: Computer ScienceComputer Science (R0)

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