8.1 Abstract
In this chapter we will describe a Design-for-Test (DfT) methodology for systems-on-chip. We have developed a hybrid Built-In Self-Test (BIST) approach, where the test set is assembled from pseudorandom test patterns that are generated online and deterministic test patterns that are generated offline and stored in the system. We have analyzed the aspects related to the cost calculation of such a hybrid BIST approach and will propose a test cost minimization strategy for single-core designs. We have then extended the same approach for multi-core designs and developed a test time minimization methodology under tester memory constraints. We will demonstrate the applicability and efficiency of the proposed approach for cores with different core-level DfT structures and for systems with different system-level test architectures.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Agrawal VD, Kime CR, Saluja KK (1993) A tutorial on built-in self-test. IEEE Design and Test of Computers, (March): 69-77.
Bardell PH, McAnney WH, Savir J (1987) Built-in test for VLSI pseudorandom techniques. John Wiley and Sons.
Brglez F, Fujiwara H (1985) A neutral netlist of 10 combinational benchmark circuits and a target translator in Fortran. In: Proc. IEEE Int. Symp. on Circuits and Systems, 663–698.
Chatterjee M, Pradhan DK (1995) A novel pattern generator for near-perfect fault-coverage. In: Proc. IEEE VLSI Test Symposium, 417–425.
Glover F (1986) Future paths for integer programming and links to artificial intelligence. Computers & Ops. Res., (5): 533–549.
Golomb SW (1982) Shift register sequences. Aegan Park Press, Laguna Hills.
Hellebrand S, Tarnick S, Rajski J, Courtois B (1992) Generation of vector patterns through reseeding of multiple-polynomial linear feedback shift registers. In: Proc. IEEE Int. Test Conference, 120–129.
Hellebrand S, Wunderlich H-J, Hertwig A (1998) Mixed-mode BIST using embedded processors. Journal of Electronic Testing: Theory and Applications, (12): 127–138.
Jervan G, Peng Z, Ubar R (2000) Test cost minimization for hybrid BIST. In: Proc. IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 283–291.
Jervan G, Peng Z, Ubar R, Kruus H (2002) A hybrid BIST architecture and its optimization for SOC testing. In: Proc. IEEE International Symposium on Quality Electronic Design, 273–279.
Jervan G, Eles P, Peng Z, Ubar R, Jenihhin M (2003) Test time minimization for hybrid BIST of core-based systems. In: Proc. 12th IEEE Asian Test Symposium, 318–323.
Kirkpatrick S, Gelatt CD, Vecchi MP (1983) Optimization by simulated annealing. Science, 220(4598): 671–680.
Lee K-J, Chen J-J, Huang C-H (1999) Broadcasting test patterns to multiple circuits. IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems, 18(12): 1793–1802.
Sugihara M, Date H, Yasuura H (2000) Analysis and minimization of test time in a combined BIST and external test approach. In: Proc. IEEE Design, Automation & Test In Europe Conference, 134–140.
Touba NA, McCluskey EJ (1995) Synthesis of mapping logic for generating transformed pseudo-random patterns for BIST. In: Proc. IEEE Int. Test Conference, 674–682.
Tallinn Technical University (1999) Turbo Tester Reference Manual. Version 3.99.03, http://www.pld.ttu.ee/tt
Ubar R, Jervan G, Peng Z, Orasson E, Raidma R (2001) Fast test cost calculation for hybrid BIST in digital systems. In: Proc. Euromicro Symposium on Digital Systems Design, 318–325.
Ubar R, Kruus H, Jervan G, Peng Z (2001) Using Tabu search method for optimizing the cost of hybrid BIST. In: Proc. 16th Conference on Design of Circuits and Integrated Systems, 445–450.
Ubar R, Jenihhin M, Jervan G, Peng Z (2004) Hybrid BIST optimization for core-based systems with test pattern broadcasting. In: Proc. IEEE Int. Workshop on Electronic Design, Test and Applications, 3–8.
Yarmolik VN, Kachan IV (1993) Self-checking VLSI design. Elsevier Science Ltd
Zacharia N, Rajski J, Tyzer J (1995) Decompression of test data using variable-length seed LFSRs. IN: Proc. IEEE 13th VLSI Test Symposium, 426–433.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2005 Springer-Verlag London Limited
About this chapter
Cite this chapter
Jervan, G., Ubar, R., Peng, Z., Eles, P. (2005). An Approach to System-level Design for Test. In: Sonza Reorda, M., Peng, Z., Violante, M. (eds) System-level Test and Validation of Hardware/Software Systems. Springer Series in Advanced Microelectronics, vol 17. Springer, London. https://doi.org/10.1007/1-84628-145-8_8
Download citation
DOI: https://doi.org/10.1007/1-84628-145-8_8
Publisher Name: Springer, London
Print ISBN: 978-1-85233-899-2
Online ISBN: 978-1-84628-145-7
eBook Packages: EngineeringEngineering (R0)