Abstract
The determination of the exact values of (n,m) or equivalently (d, ϑ)for an individual singlewall nanotube (SWNT) is of great importance, in particular for comparison with transport measurements. In this study, the selected area electron diffraction technique is used to investigate the structure of individual carbon nanotubes grown by chemical vapor deposition (CVD) directly on TEM-Si3N4 membranes.
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References
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THUNE, E. et al. (2006). STRUCTURAL DETERMINATION OF INDIVIDUAL SINGLEWALL CARBON NANOTUBE BY NANOAREA ELECTRON DIFFRACTION. In: Popov, V.N., Lambin, P. (eds) Carbon Nanotubes. NATO Science Series II: Mathematics, Physics and Chemistry, vol 222. Springer, Dordrecht. https://doi.org/10.1007/1-4020-4574-3_3
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DOI: https://doi.org/10.1007/1-4020-4574-3_3
Publisher Name: Springer, Dordrecht
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