Conclusions
A micro-code programmable BIST is the most flexible of self-test structures. The memory test patterns can easily be modified based on new fault modeling or to assist in the characterization of a new memory design. A micro-code BIST needs to be tailored to the memory design being tested and therefore a wide variety of micro-code instruction word styles exist. Many unique patterns and DFT features can be programmed with a microcoded memory BIST; some of those items include pause delay duration for retention testing or the number of times a given loop is executed. Each of these features enables a micro-code BIST to be highly flexible to support very challenging memory testing.
“...if ye keep in memory what I preached unto you ...”
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© 2003 Kluwer Academic Publishers
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(2003). Micro-Code BIST. In: High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test. Frontiers in Electronic Testing, vol 22A. Springer, Boston, MA. https://doi.org/10.1007/0-306-47972-9_12
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DOI: https://doi.org/10.1007/0-306-47972-9_12
Publisher Name: Springer, Boston, MA
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