High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

  • R. Dean Adams

Part of the Frontiers in Electronic Testing book series (FRET, volume 22A)

Table of contents

  1. Front Matter
    Pages i-xiii
  2. Design & Test of Memories

  3. Memory Testing

    1. Pages 103-126
    2. Pages 127-148
  4. Memory Self Test

    1. Pages 149-162
    2. Pages 163-172
    3. Pages 173-181
    4. Pages 183-193
    5. Pages 195-202
    6. Pages 203-206
  5. Back Matter
    Pages 207-247

About this book

Introduction

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully.
High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test.

High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

Keywords

design development modeling reliability testing

Authors and affiliations

  • R. Dean Adams
    • 1
  1. 1.IBMUSA

Bibliographic information

  • DOI https://doi.org/10.1007/b101876
  • Copyright Information Kluwer Academic Publishers 2003
  • Publisher Name Springer, Boston, MA
  • eBook Packages Springer Book Archive
  • Print ISBN 978-1-4020-7255-0
  • Online ISBN 978-0-306-47972-4
  • Series Print ISSN 0929-1296
  • About this book