Skip to main content
SpringerLink
Log in

In Situ X-Ray Reciprocal Space Mapping for Characterization of Nanomaterials

  • Chapter
  • First Online:
X-ray and Neutron Techniques for Nanomaterials Characterization

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 259.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 329.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 329.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Glatter O, Kratky O (1982) Small angle x-ray scattering. Academic, London/New York

    Google Scholar 

  2. Guinier A, Fournet G (1955) Small-angle scattering of X-rays. Wiley, New York

    Google Scholar 

  3. Feigin LA, Svergun DI, Taylor GW (1987) Structure analysis by small-angle X-ray and neutron scattering. Plenum Press, New York

    Book  Google Scholar 

  4. Brumberger H (1995) Modern aspects of small-angle scattering. Kluwer Academic Publishers, Dordrecht/Boston

    Book  Google Scholar 

  5. Renaud G, Lazzari R, Revenant C, Barbier A et al (2003) Real-time monitoring of growing nanoparticles. Science 300:1416

    Article  Google Scholar 

  6. Als-Nielsen J, MacMorrow D (2011) Elements of modern X-ray physics. Wiley, Chichester

    Book  Google Scholar 

  7. Yoneda Y (1963) Anomalous surface reflection of X rays. Phys Rev 131:2010

    Article  Google Scholar 

  8. Holý V, Pietsch U, Baumbach T (1999) High-resolution X-ray scattering from thin films and multilayers. Springer, Berlin/New York

    Google Scholar 

  9. Holy V, Baumbach T (1994) Nonspecular X-ray reflection from rough multilayers. Phys Rev B 49:10668

    Article  Google Scholar 

  10. Holy V, Kubena J, Ohlidal I, Lischka K et al (1993) X-ray reflection from rough layered systems. Phys Rev B 47:15896

    Article  Google Scholar 

  11. Renaud G, Lazzari R, Leroy F (2009) Probing surface and interface morphology with grazing incidence small angle X-ray scattering. Surf Sci Rep 64:255

    Article  Google Scholar 

  12. Lazzari R (2002) IsGISAXS: a program for grazing-incidence small-angle X-ray scattering analysis of supported islands. J Appl Crystallogr 35:406

    Article  Google Scholar 

  13. Birkholz M, Fewster PF, Genzel C (2006) Thin film analysis by X-ray scattering. Wiley-VCH, Weinheim

    Google Scholar 

  14. http://www.bornagainproject.org/

  15. http://www.pprime.fr/?q=fr/nanoparticules-nanostructures

  16. Tate MP, Urade VN, Kowalski JD, Wei T-c et al (2006) Simulation and interpretation of 2D diffraction patterns from self-assembled nanostructured films at arbitrary angles of incidence: from grazing incidence (above the critical angle) to transmission perpendicular to the substrate. J Phys Chem B 110:9882

    Article  Google Scholar 

  17. Chourou ST, Sarje A, Li XS, Chan ER et al (2013) HipGISAXS: a high-performance computing code for simulating grazing-incidence X-ray scattering data. J Appl Crystallogr 46:1781

    Article  Google Scholar 

  18. Daillant J, Gibaud A (2009) X-ray and neutron reflectivity: principles and applications. Springer, Berlin/Heidelberg

    Book  Google Scholar 

  19. Bennett JM, Mattsson L (1989) Introduction to surface roughness and scattering. Optical Society of America, Washington, DC

    Google Scholar 

  20. Pelliccione M, Lu TM (2008) Evolution of thin film morphology: modeling and simulations. Springer, New York/London

    Google Scholar 

  21. Franceschetti G, Riccio D (2007) Scattering, natural surfaces, and fractals. Elsevier Academic Press, Amsterdam/Boston

    Google Scholar 

  22. Onuki H, Elleaume P (2003) Undulators, wigglers, and their applications. Taylor & Francis, London/New York

    Book  Google Scholar 

  23. Liu D-G, Chang C-H, Liu C-Y, Chang S-H et al (2009) A dedicated small-angle X-ray scattering beamline with a superconducting wiggler source at the NSRRC. J Synchrotron Radiat 16:97

    Article  Google Scholar 

  24. Döhrmann R, Botta S, Buffet A, Santoro G et al (2013) A new highly automated sputter equipment for in situ investigation of deposition processes with synchrotron radiation. Amsterdam 84:043901

    Google Scholar 

  25. Santoro G, Buffet A, Döhrmann R, Yu S et al (2014) Use of intermediate focus for grazing incidence small and wide angle x-ray scattering experiments at the beamline P03 of PETRA III, DESY. Rev Sci Instrum 85:043901

    Article  Google Scholar 

  26. Borsali R, Pecora R (2008) Soft-matter characterization. Springer, New York

    Book  Google Scholar 

  27. Zschornack G (2006) Handbook of X-ray data. Springer, New York

    Google Scholar 

  28. Otendal M, Tuohimaa T, Vogt U, Hertz HM (2008) A 9 keV electron-impact liquid-gallium-jet x-ray source. Rev Sci Instrum 79:016102

    Article  Google Scholar 

  29. Siffalovic P, Vegso K, Jergel M, Majkova E et al (2010) Measurement of nanopatterned surfaces by real and reciprocal space techniques. Meas Sci Rev 10:153

    Article  Google Scholar 

  30. Michaelsen C, Wiesmann J, Hoffmann C, Wulf K et al (2002) Recent developments of multilayer mirror optics for laboratory x-ray instrumentation. X-Ray Mirrors, Crystals, and Multilayers Ii 4782:143

    Article  Google Scholar 

  31. Wiesmann J, Graf J, Hoffmann C, Hembd A et al (2009) X-ray diffractometry with low power microfocus sources – new possibilities in the lab. Part Part Syst Charact 26:112

    Article  Google Scholar 

  32. Michaelsen C, Wiesmann J, Hoffmann C, Oehr A et al (2003) Optimized performance of graded multilayer optics for X-ray single crystal diffraction. Advances in Mirror Technology for X-Ray, Euv Lithography, Laser, and Other Applications 5193:211

    Article  Google Scholar 

  33. Hertlein F, Oehr A, Hoffmann C, Michaelsen C et al (2006) State-of-the-art of multilayer optics for laboratory X-ray devices. Part Part Syst Charact 22:378

    Article  Google Scholar 

  34. Hemberg O, Otendal M, Hertz HM (2003) Liquid-metal-jet anode electron-impact x-ray source. Appl Phys Lett 83:1483

    Article  Google Scholar 

  35. Hemberg O, Otendal M, Hertz HM (2004) Liquid-metal-jet anode X-ray tube. Opt Eng 43:1682

    Article  Google Scholar 

  36. De Caro L, Altamura D, Vittoria FA, Carbone G et al (2012) A superbright X-ray laboratory microsource empowered by a novel restoration algorithm. J Appl Crystallogr 45:1228

    Article  Google Scholar 

  37. De Caro L, Altamura D, Sibillano T, Siliqi D et al (2013) Rat-tail tendon fiber SAXS high-order diffraction peaks recovered by a superbright laboratory source and a novel restoration algorithm. J Appl Crystallogr 46:672

    Article  Google Scholar 

  38. He BB (2009) Two-dimensional x-ray diffraction. Wiley, Hoboken

    Book  Google Scholar 

  39. Wignall GD, Lin JS, Spooner S (1990) Reduction of parasitic scattering in small-angle X-ray scattering by a three-pinhole collimating system. J Appl Crystallogr 23:241

    Article  Google Scholar 

  40. Li Y, Beck R, Huang T, Choi MC et al (2008) Scatterless hybrid metal-single-crystal slit for small-angle X-ray scattering and high-resolution X-ray diffraction. J Appl Crystallogr 41:1134

    Article  Google Scholar 

  41. Korytar D, Vagovic P, Vegso K, Siffalovic P et al (2013) Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging. J Appl Crystallogr 46:945

    Article  Google Scholar 

  42. Jergel M, Siffalovic P, Vegso K, Majkova E et al (2013) Extreme X-ray beam compression for a high-resolution table-top grazing-incidence small-angle X-ray scattering setup. J Appl Crystallogr 46:1544

    Article  Google Scholar 

  43. Schlepütz CM, Herger R, Willmott PR, Patterson BD et al (2005) Improved data acquisition in grazing-incidence X-ray scattering experiments using a pixel detector. Acta Crystallogr Sect A Found Crystallogr 61:418

    Article  Google Scholar 

  44. Kraft P, Bergamaschi A, Broennimann C, Dinapoli R et al (2009) Performance of single-photon-counting PILATUS detector modules. J Synchrotron Radiat 16:368

    Article  Google Scholar 

  45. Wernecke J, Gollwitzer C, Muller P, Krumrey M (2014) Characterization of an in-vacuum PILATUS 1M detector. J Synchrotron Radiat 21:529

    Article  Google Scholar 

  46. Chitu L, Siffalovic P, Majkova E, Jergel M et al (2010) Modified Langmuir-Blodgett deposition of nanoparticles – measurement of 2D to 3D ordered arrays. Meas Sci Rev 10:162

    Article  Google Scholar 

  47. Siffalovic P, Majkova E, Jergel M, Vegso K et al (2012) Self-assembly of nanoparticles at solid and liquid surfaces. In: Hashim A (ed) Smart nanoparticles technology. INTECH, Rijeka, pp 441–466

    Google Scholar 

  48. Sun SH, Murray CB, Weller D, Folks L et al (2000) Monodisperse FePt nanoparticles and ferromagnetic FePt nanocrystal superlattices. Science 287:1989

    Article  Google Scholar 

  49. Bigioni TP, Lin XM, Nguyen TT, Corwin EI et al (2006) Kinetically driven self assembly of highly ordered nanoparticle monolayers. Nat Mater 5:265

    Article  Google Scholar 

  50. Shevchenko EV, Talapin DV, Kotov NA, O'Brien S et al (2006) Structural diversity in binary nanoparticle superlattices. Nature 439:55

    Article  Google Scholar 

  51. Talapin DV, Shevchenko EV, Bodnarchuk MI, Ye X et al (2009) Quasicrystalline order in self-assembled binary nanoparticle superlattices. Nature 461:964

    Article  Google Scholar 

  52. Fan JA, Wu C, Bao K, Bao J et al (2010) Self-assembled plasmonic nanoparticle clusters. Science 328:1135

    Article  Google Scholar 

  53. Macfarlane RJ, Lee B, Jones MR, Harris N et al (2011) Nanoparticle superlattice engineering with DNA. Science 334:204

    Article  Google Scholar 

  54. Luby S, Chitu L, Jergel M, Majkova E et al (2012) Oxide nanoparticle arrays for sensors of CO and NO2 gases. Vacuum 86:590

    Article  Google Scholar 

  55. Herrmann J, Müller KH, Reda T, Baxter GR et al (2007) Nanoparticle films as sensitive strain gauges. Appl Phys Lett 91:183105

    Article  Google Scholar 

  56. Siffalovic P, Chitu L, Vegso K, Majkova E et al (2010) Towards strain gauges based on a self-assembled nanoparticle monolayer-SAXS study. Nanotechnology 21:385702

    Article  Google Scholar 

  57. Nie S, Emory SR (1997) Probing single molecules and single nanoparticles by surface-enhanced Raman scattering. Science 275:1102

    Article  Google Scholar 

  58. Santoro G, Yu S, Schwartzkopf M, Zhang P et al (2014) Silver substrates for surface enhanced Raman scattering: correlation between nanostructure and Raman scattering enhancement. Appl Phys Lett 104:243107

    Article  Google Scholar 

  59. Capek I (2004) Preparation of metal nanoparticles in water-in-oil (w/o) microemulsions. Adv Colloid Interface Sci 110:49

    Article  Google Scholar 

  60. Siffalovic P, Majkova E, Chitu L, Jergel M et al (2007) Self-assembly of iron oxide nanoparticles studied by time-resolved grazing-incidence small-angle x-ray scattering. Phys Rev B 76:195432

    Article  Google Scholar 

  61. Siffalovic P, Majkova E, Chitu L, Jergel M et al (2008) Real-time tracking of superparamagnetic nanoparticle self-assembly. Small 4:2222

    Article  Google Scholar 

  62. Vegso K, Siffalovic P, Majkova E, Jergel M et al (2012) Nonequilibrium phases of nanoparticle Langmuir films. Langmuir 28:10409

    Article  Google Scholar 

  63. Vegso K, Siffalovic P, Benkovicova M, Jergel M et al (2012) GISAXS analysis of 3D nanoparticle assemblies-effect of vertical nanoparticle ordering. Nanotechnology 23:045704

    Article  Google Scholar 

  64. Vegso K, Siffalovic P, Jergel M, Weis M et al (2014) A non-equilibrium transient phase revealed by in situ GISAXS tracking of the solvent-assisted nanoparticle self-assembly. J Nanopart Res 16:2536

    Article  Google Scholar 

  65. Eads JL, Millane RP (2001) Diffraction by the ideal paracrystal. Acta Crystallogr A 57:507

    Article  Google Scholar 

  66. Capone S, Manera MG, Taurino A, Siciliano P et al (2014) Fe3O4/γ-Fe2O3 nanoparticle multilayers deposited by the Langmuir–Blodgett technique for gas sensors application. Langmuir 30:1190

    Article  Google Scholar 

  67. Siffalovic P, Vegso K, Benkovicova M, Jergel M et al (2014) Reassembly and oxidation of a silver nanoparticle bilayer probed by in situ X-ray reciprocal space mapping. J Phys Chem C 118:7195

    Article  Google Scholar 

  68. Hirota E, Sakakima H, Inomata K (eds) (2002) Giant magneto-resistance devices. Springer, Berlin/Heidelberg

    Google Scholar 

  69. Spiller E (1994) Soft X-ray optics. SPIE Optical Engineering Press, Bellingham

    Book  Google Scholar 

  70. Venables J (2000) Introduction to surface and thin film processes. Cambridge University Press, Cambridge; New York

    Book  Google Scholar 

  71. Lüth H (2010) Solid surfaces, interfaces and thin films. Springer, Heidelberg/New York

    Book  Google Scholar 

  72. Freund LB, Suresh S (2009) Thin film materials: stress, defect formation, and surface evolution. Cambridge University Press, Cambridge/New York

    Google Scholar 

  73. Ohring M (2001) Materials science of thin films. Elsevier Science, Singapore

    Google Scholar 

  74. Barabási A-L, Stanley HE (1995) Fractal concepts in surface growth. Press Syndicate of the University of Cambridge, New York

    Book  Google Scholar 

  75. Renaud G, Ducruet M, Ulrich O, Lazzari R (2004) Apparatus for real time in situ quantitative studies of growing nanoparticles by grazing incidence small angle X-ray scattering and surface differential reflectance spectroscopy. Nucl Inst Methods Phys Res B 222:667

    Article  Google Scholar 

  76. Hodas M 2015 doi:10.1117/12.2187999

  77. Schwartzkopf M, Buffet A, Korstgens V, Metwalli E et al (2013) From atoms to layers: in situ gold cluster growth kinetics during sputter deposition. Nanoscale 5:5053

    Article  Google Scholar 

  78. Siffalovic P, Jergel M, Majkova E (2011) GISAXS – probe of buried interfaces in multilayered thin films. In: Bauwens CM (ed) X-ray scattering. Nova Science Publishers, New York, pp 1–54

    Google Scholar 

  79. Stearns DG (1992) X-ray-scattering from interfacial roughness in multilayer structures. J Appl Phys 71:4286

    Article  Google Scholar 

  80. Salditt T, Lott D, Metzger TH, Peisl J et al (1996) Observation of the Huygens-principle growth mechanism in sputtered W/Si multilayers. Europhys Lett 36:565

    Article  Google Scholar 

  81. Salditt T, Metzger TH, Peisl J, Reinker B et al (1995) Determination of the height-height correlation-function of rough surfaces from diffuse-X-ray scattering. Europhys Lett 32:331

    Article  Google Scholar 

  82. Salditt T, Lott D, Metzger TH, Peisl J et al (1996) Characterization of interface roughness in W/Si multilayers by high resolution diffuse X-ray scattering. Phys B Condens Matter 221:13

    Article  Google Scholar 

  83. Salditt T, Metzger TH, Brandt C, Klemradt U et al (1995) Determination of the static scaling exponent of self-affine interfaces by nonspecular X-ray-scattering. Phys Rev B 51:5617

    Article  Google Scholar 

  84. Salditt T, Metzger TH, Peisl J (1994) Kinetic roughness of amorphous multilayers studied by diffuse-X-ray scattering. Phys Rev Lett 73:2228

    Article  Google Scholar 

  85. Siffalovic P, Majkova E, Chitu L, Jergel M et al (2009) Characterization of Mo/Si soft X-ray multilayer mirrors by grazing-incidence small-angle X-ray scattering. Vacuum 84:19

    Article  Google Scholar 

  86. Sinha SK, Sirota EB, Garoff S, Stanley HB (1988) X-ray and neutron-scattering from rough surfaces. Phys Rev B 38:2297

    Article  Google Scholar 

  87. Edwards SF, Wilkinson DR (1982) The surface statistics of a granular aggregate. Proc R Soc A 381:17

    Article  Google Scholar 

  88. Siffalovic P, Jergel M, Chitu L, Majkova E et al (2010) Interface study of a high-performance W/B4C X-ray mirror. J Appl Crystallogr 43:1431

    Article  Google Scholar 

  89. Wu W-R, Jeng US, Su C-J, Wei K-H et al (2011) Competition between fullerene aggregation and poly(3-hexylthiophene) crystallization upon annealing of bulk heterojunction solar cells. ACS Nano 5:6233

    Article  Google Scholar 

  90. Li G, Yao Y, Yang H, Shrotriya V et al (2007) “Solvent annealing” effect in polymer solar cells based on poly(3-hexylthiophene) and methanofullerenes. Adv Funct Mater 17:1636

    Article  Google Scholar 

  91. Ziberi B, Cornejo M, Frost F, Rauschenbach B (2009) Highly ordered nanopatterns on Ge and Si surfaces by ion beam sputtering. J Phys Condens Matter 21:224003

    Article  Google Scholar 

Download references

Acknowledgments

The work was supported by the Slovak Research and Development Agency, project no. APVV-0308-11; Grant Agency VEGA Bratislava, project no. 2/0004/15; and Centre of Excellence SAS FUNMAT. The support of the M-ERA-Net project XOPTICS and COST Actions MP1203 and MP1207 is also acknowledged.

Author information

Authors and Affiliations

  1. Institute of Physics, Slovak Academy of Sciences, Dubravska cesta 9, 84511, Bratislava, Slovakia

    Peter Siffalovic, Karol Vegso, Martin Hodas, Matej Jergel, Yuriy Halahovets, Marco Pelletta & Eva Majkova

  2. Institute of Electrical Engineering, Slovak Academy of Sciences, Dubravska cesta 9, 84104, Bratislava, Slovakia

    Dusan Korytar & Zdeno Zaprazny

Authors
  1. Peter Siffalovic
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Karol Vegso
    View author publications

    You can also search for this author in PubMed Google Scholar

  3. Martin Hodas
    View author publications

    You can also search for this author in PubMed Google Scholar

  4. Matej Jergel
    View author publications

    You can also search for this author in PubMed Google Scholar

  5. Yuriy Halahovets
    View author publications

    You can also search for this author in PubMed Google Scholar

  6. Marco Pelletta
    View author publications

    You can also search for this author in PubMed Google Scholar

  7. Dusan Korytar
    View author publications

    You can also search for this author in PubMed Google Scholar

  8. Zdeno Zaprazny
    View author publications

    You can also search for this author in PubMed Google Scholar

  9. Eva Majkova
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Peter Siffalovic .

Editor information

Editors and Affiliations

  1. Integrated Mesoscale Architectures for Sustainable Catalysis (IMASC), Rowland Institute of Science, Harvard University, Cambridge, Massachusetts, USA

    Challa S.S.R. Kumar

Rights and permissions

Reprints and permissions

Copyright information

© 2016 Springer-Verlag Berlin Heidelberg

About this chapter

Cite this chapter

Siffalovic, P. et al. (2016). In Situ X-Ray Reciprocal Space Mapping for Characterization of Nanomaterials. In: Kumar, C. (eds) X-ray and Neutron Techniques for Nanomaterials Characterization. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-662-48606-1_9

Download citation

Publish with us

Policies and ethics

Search

Navigation