Abstract
We have recorded electron energy-loss near-edge spectra (ELNES) in a monochromated 200kV transmission electron microscope and compare the results with X-ray absorption near-edge spectra (XANES) acquired previously by another group on a high-resolution synchrotron radiation beamline.
formerly at: Center of Advanced European Studies and Research (caesar) Ludwig-Erhard-Allee 2 D-53175 Bonn Germany
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We thank H. Schmid, University of Bonn, for the provision of the specimen material.
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Walther, T., Stegmann, H. (2008). Comparison of monochromated electron energy-loss with X-ray absorption near-edge spectra: ELNES vs. XANES. In: Luysberg, M., Tillmann, K., Weirich, T. (eds) EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_33
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DOI: https://doi.org/10.1007/978-3-540-85156-1_33
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