Overview
- Editors:
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Ping-chin Cheng
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Department of Electrical and Computer Engineering, State University of New York at Buffalo, Buffalo, USA
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Gwo-jen Jan
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Department of Electrical Engineering School of Engineering, National Taiwan University, Taipei, Taiwan, Republic of China
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Table of contents (25 chapters)
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- Yoshinori Nagai, Yasushi Nakajima, Yutaka Watanabe, Shigetaro Ogura, Koshi Uyeda, Yoshio Shimanuki et al.
Pages 263-288
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- F. Cinotti, M. C. Voisin, C. Jacobsen, J. M. Kenney, J. Kirz, I. McNulty et al.
Pages 311-327
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- Gwo-Jen Jan, Liang-Fung Chen, Yau-Jong Twu, Poh-Kung Tseng, Chang-Po Chen
Pages 328-335
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- J. Pawlak, P. C. Cheng, D. M. Shinozaki
Pages 336-345
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Back Matter
Pages 361-415
About this book
In 1979, a conference on x-ray microscopy was organized by the New York Academy of Sciences, and in 1983, the Second Interna tional Symposium on X-ray Imaging was organized by the Akademie der Wissenschaften in Gottingen, Federal Republic of Germany. This volume contains the contributions to the symposium "X-ray Microscopy '86", held in Taipei, Taiwan, the Republic of China in August 1986. This is the first volume which intends to provide up-to date information on x-ray imaging to biologists, therefore, emphasis was given to specimen preparation techniques and image interpreta tion. Specimen preparation represents a major part of every microscopy work, therefore, it should be strongly emphasized in this emerging field of x-ray microscopy. Theoretically, x-ray microscopy offers the potential for the study of unfixed, hydrated biological ma terials. Since very few biological system can be directly observed without specimen preparation, we would like to emphasize that new information on biological specimens can only be obtained if the speci men is properly prepared. In the past decade, many of the published x-ray images were obtained from poorly prepared biological speci mens, mainly air-dried materials. Therefore, one of the goals of this conference is to bring the importance of specimen preparation to the attention of x-ray microscopy community. X-ray microscopy can be subdivided into several major areas. They are the classic x-ray projection microscope, x-ray contact imag ing (microradiography) and the more recent x-ray scanning micro scope, x-ray photoelectron microscope and x-ray imaging microscope.
Editors and Affiliations
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Department of Electrical and Computer Engineering, State University of New York at Buffalo, Buffalo, USA
Ping-chin Cheng
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Department of Electrical Engineering School of Engineering, National Taiwan University, Taipei, Taiwan, Republic of China
Gwo-jen Jan