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  • Book
  • © 2013

Ellipsometry at the Nanoscale

  • Provides different aspects and opinion on a rapidly evolving field

  • Reviews recent applications of polarimetric techniques to nanomaterials

  • Written by renomed experts in the field

  • Includes supplementary material: sn.pub/extras

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eBook USD 269.00
Price excludes VAT (USA)
  • ISBN: 978-3-642-33956-1
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book USD 349.99
Price excludes VAT (USA)
Hardcover Book USD 349.99
Price excludes VAT (USA)

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Table of contents (21 chapters)

  1. Front Matter

    Pages i-xxiv
  2. Advanced Mueller Ellipsometry Instrumentation and Data Analysis

    • Enric Garcia-Caurel, Razvigor Ossikovski, Martin Foldyna, Angelo Pierangelo, Bernard Drévillon, Antonello De Martino
    Pages 31-143
  3. Relationship Between Surface Morphology and Effective Medium Roughness

    • Angel Yanguas-Gil, Herbert Wormeester
    Pages 179-202
  4. Plasmonics and Effective-Medium Theory

    • David E. Aspnes
    Pages 203-224
  5. Thin Films of Nanostructured Noble Metals

    • Herbert Wormeester, Thomas W. H. Oates
    Pages 225-256
  6. Spectroscopic Ellipsometry on Metallic Gratings

    • Michael Bergmair, Kurt Hingerl, Peter Zeppenfeld
    Pages 257-311
  7. Ellipsometry at the Nanostructure

    • Yasuhiro Mizutani, Yukitoshi Otani
    Pages 313-323
  8. Real-Time Ellipsometry for Probing Charge-Transfer Processes at the Nanoscale

    • Maria Losurdo, April S. Brown, Giovanni Bruno
    Pages 453-491
  9. Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications

    • Alain C. Diebold, Florence J. Nelson, Vimal K. Kamineni
    Pages 557-581
  10. Ellipsometry of Semiconductor Nanocrystals

    • Peter Petrik, Miklos Fried
    Pages 583-606
  11. Thin Film Applications in Research and Industry Characterized by Spectroscopic Ellipsometry

    • Denis Cattelan, Céline Eypert, Marzouk Kloul, Mélanie Gaillet, Jean-Paul Gaston, Roland Seitz et al.
    Pages 629-667

About this book

This book presents and introduces ellipsometry in nanoscience and nanotechnology making a bridge between the classical and nanoscale optical behaviour of materials. It delineates the role of the non-destructive and non-invasive optical diagnostics of ellipsometry in improving science and technology of nanomaterials and related processes by illustrating its exploitation, ranging from fundamental studies of the physics and chemistry of nanostructures to the ultimate goal of turnkey manufacturing control. This book is written for a broad readership: materials scientists, researchers, engineers, as well as students and nanotechnology operators who want to deepen their knowledge about both basics and applications of ellipsometry to nanoscale phenomena. It starts as a general introduction for people curious to enter the fields of ellipsometry and polarimetry applied to nanomaterials and progresses to articles by experts on specific fields that span from plasmonics, optics, to semiconductors and flexible electronics. The core belief reflected in this book is that ellipsometry applied at the nanoscale offers new ways of addressing many current needs. The book also explores forward-looking potential applications.

Keywords

  • Correlation measurements
  • Kerr Spectroscopy
  • Plasmonics theory
  • Polarimetry
  • Polarized light

Editors and Affiliations

  • CNR Bari, Ist. Metodologie Inorganiche, Università Bari, Bari, Italy

    Maria Losurdo

  • Zentrum für Oberflächen- und, Nanoanalytik (ZONA), Universität Linz, Linz, Austria

    Kurt Hingerl

Bibliographic Information

Buying options

eBook USD 269.00
Price excludes VAT (USA)
  • ISBN: 978-3-642-33956-1
  • Instant PDF download
  • Readable on all devices
  • Own it forever
  • Exclusive offer for individuals only
  • Tax calculation will be finalised during checkout
Softcover Book USD 349.99
Price excludes VAT (USA)
Hardcover Book USD 349.99
Price excludes VAT (USA)