© 2015

Noncontact Atomic Force Microscopy

Volume 3

  • Seizo Morita
  • Franz J. Giessibl
  • Ernst Meyer
  • Roland Wiesendanger

Part of the NanoScience and Technology book series (NANO)

Table of contents

  1. Front Matter
    Pages i-xxii
  2. Seizo Morita
    Pages 1-8
  3. Mehmet Z. Baykara, Udo D. Schwarz
    Pages 9-28
  4. P. Hapala, M. Ondráček, O. Stetsovych, M. Švec, P. Jelínek
    Pages 29-49
  5. Masayuki Abe, Yoshiaki Sugimoto, Seizo Morita
    Pages 51-69
  6. Alfred John Weymouth, Franz J. Giessibl
    Pages 71-92
  7. Marcin Kisiel, Markus Samadashvili, Urs Gysin, Ernst Meyer
    Pages 93-110
  8. Alexander Schwarz, Stefan Heinze
    Pages 111-125
  9. Felix Kling, Ralf Bechstein, Philipp Rahe, Angelika Kühnle
    Pages 147-171
  10. Fabian Schulz, Sampsa Hämäläinen, Peter Liljeroth
    Pages 173-194
  11. Rémy Pawlak, Shigeki Kawai, Thilo Glatzel, Ernst Meyer
    Pages 195-222
  12. Leo Gross, Bruno Schuler, Fabian Mohn, Nikolaj Moll, Jascha Repp, Gerhard Meyer
    Pages 223-246
  13. Adam Sweetman, Samuel Paul Jarvis, Philip Moriarty
    Pages 247-274
  14. Christin Büchner, Leonid Lichtenstein, Markus Heyde, Hans-Joachim Freund
    Pages 327-353
  15. David Z. Gao, Alexander Schwarz, Alexander L. Shluger
    Pages 355-378
  16. Bernhard Reischl, Filippo Federici Canova, Peter Spijker, Matt Watkins, Adam Foster
    Pages 379-409

About this book


This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.


Atom Manipulation Atomic Force Microscopy Atomic Resolution Atomic/Molecular Manipulation Chemical Structure Force Mapping with Atomic Resolution Liquid AFM Magnetic Exchange Force Microscopy Scanning Probe Techniques Scanning Tunneling Microscopy

Editors and affiliations

  • Seizo Morita
    • 1
  • Franz J. Giessibl
    • 2
  • Ernst Meyer
    • 3
  • Roland Wiesendanger
    • 4
  1. 1.Institute of Scientific and Industrial ResearchOsaka University Nanoscience and Nanotechnology CenterOsakaJapan
  2. 2.Institute of Experimental and Applied PhysicsUniversity of RegensburgRegensburgGermany
  3. 3.Department of PhysicsUniversity of BaselBaselSwitzerland
  4. 4.ERC Advanced Research Group "FURORE"University of HamburgHamburgGermany

Bibliographic information