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Structural, Syntactic, and Statistical Pattern Recognition

Joint IAPR International Workshops SSPR 2002 and SPR 2002 Windsor, Ontario, Canada, August 6–9, 2002 Proceedings

  • Terry Caelli
  • Adnan Amin
  • Robert P. W. Duin
  • Dick de Ridder
  • Mohamed Kamel

Part of the Lecture Notes in Computer Science book series (LNCS, volume 2396)

Table of contents

  1. Front Matter
    Pages I-XVI
  2. Invited Talks

    1. Diego Macrini, Ali Shokoufandeh, Sven Dickinson, Kaleem Siddiqi, Steven Zucker
      Pages 1-14
    2. Thomas G. Dietterich
      Pages 15-30
    3. Edwin Hancock, Richard C. Wilson
      Pages 31-46
  3. SSPR

    1. Graphs, Grammars and Languages

      1. Carlos D. Martínez-Hinarejos, Alfonso Juan, Francisco Casacuberta, Ramón Mollineda
        Pages 47-55
      2. Jose L. Verdú-Mas, Mikel L. Forcada, Rafael C. Carrasco, Jorge Calera-Rubio
        Pages 56-63
    2. Graphs, Strings and Grammars

      1. Barend Jacobus van Wyk, Michaël Antonie van Wyk
        Pages 74-83
      2. Bin Luo, Richard C. Wilson, Edwin R. Hancock
        Pages 83-93
      3. Stefan Fischer, Kaspar Gilomen, Horst Bunke
        Pages 94-103
      4. Antonio Robles-Kelly, Edwin R. Hancock
        Pages 104-112
      5. Andrea Torsello, Edwin R. Hancock
        Pages 113-122
      6. Horst Bunke, Pasquale Foggia, Corrado Guidobaldi, Carlo Sansone, Mario Vento
        Pages 123-132
    3. Graphs, Strings and Grammars

    4. Image Shape Analysis and Application

      1. Ezra Tassone, Geoff West, Svetha Venkatesh
        Pages 195-204
      2. Abdullah A. Al-Shaher, Edwin R. Hancock
        Pages 205-215
      3. Fabio Sartori, Edwin R. Hancock
        Pages 216-224
      4. Georg Langs, Horst Bischof, Walter G. Kropatsch
        Pages 234-243
      5. Mihai Lazarescu, Andrew Turpin, Svetha Venkatesh
        Pages 243-251
  4. Poster Papers

    1. Graphs, Strings, Grammars and Language

      1. Barend Jacobus van Wyk, Michaël Antonie van Wyk, Hubert Edward Hanrahan
        Pages 263-271
      2. Mathieu Delalandre, Pierre Héroux, Sébastien Adam, Eric Trupin, Jean-Marc Ogier
        Pages 281-290
      3. Juan Humberto Sossa Azuela, Francisco Cuevas de la Rosa, Héctor Benitez
        Pages 301-309
    2. Image Analysis and Feature Extraction

      1. Ilkay Ulusoy, Edwin R. Hancock, Ugur Halici
        Pages 320-328
      2. Hassan Alam, Ahmad Fuad Rezaur Rahman, Timotius Tjahjadi, Hua Cheng, Paul Llido, Aman Kumar et al.
        Pages 339-347
    3. Documents and OCR

      1. Changhua Wu, Gady Agam
        Pages 348-357
      2. G. S. Lehal, Chandan Singh
        Pages 358-367
      3. Antoni Grau, Joan Climent, Francesc Serratosa, Alberto Sanfeliu
        Pages 368-377
      4. Michael Droettboom, Ichiro Fujinaga, Karl MacMillan
        Pages 378-387
      5. Juan Humberto Sossa Azuela, Aurelio Velázquezco, Serguei Levachkine
        Pages 387-395
  5. SPR

    1. Density Estimation and Distribution Models

      1. Tsuyoshi Kato, Shinichiro Omachi, Hirotomo Aso
        Pages 405-413
      2. Mohammad Sadeghi, Josef Kittler
        Pages 414-423
    2. Multi-classifiers and Fusion

      1. Ray Somorjai, Arunas Janeliunas, Richard Baumgartner, Sarunas Raudys
        Pages 433-441
    3. Feature Extraction and Selection

      1. Pavel Paclík, Robert P. W. Duin, Geert M. P. van Kempen, Reinhard Kohlus
        Pages 461-469

About these proceedings

Introduction

This volume contains all papers presented at SSPR 2002 and SPR 2002 hosted by the University of Windsor, Windsor, Ontario, Canada, August 6-9, 2002. This was the third time these two workshops were held back-to-back. SSPR was the ninth International Workshop on Structural and Syntactic Pattern Recognition and the SPR was the fourth International Workshop on Statis- cal Techniques in Pattern Recognition. These workshops have traditionally been held in conjunction with ICPR (International Conference on Pattern Recog- tion), and are the major events for technical committees TC2 and TC1, resp- tively, of the International Association of Pattern Recognition (IAPR). The workshops were held in parallel and closely coordinated. This was an attempt to resolve the dilemma of how to deal, in the light of the progressive specialization of pattern recognition, with the need for narrow-focus workshops without further fragmenting the ?eld and introducing yet another conference that would compete for the time and resources of potential participants. A total of 116 papers were received from many countries with the submission and reviewingprocesses beingcarried out separately for each workshop. A total of 45 papers were accepted for oral presentation and 35 for posters. In addition four invited speakers presented informative talks and overviews of their research. They were: Tom Dietterich, Oregon State University, USA Sven Dickinson, the University of Toronto, Canada Edwin Hancock, University of York, UK Anil Jain, Michigan State University, USA SSPR 2002 and SPR 2002 were sponsored by the IAPR and the University of Windsor.

Keywords

Classification Document Analysis Feature Extraction Graphical Pattern Recognition Object Recognition Scene Analysis Statistical Pattern Recognition Syntactic Pattern Recognition calculus cognition complexity genetic algorithms image analysis machine learning modeling

Editors and affiliations

  • Terry Caelli
    • 1
  • Adnan Amin
    • 2
  • Robert P. W. Duin
    • 3
  • Dick de Ridder
    • 3
  • Mohamed Kamel
    • 4
  1. 1.Dept. of Computing ScienceUniversity of AlbertaEdmontonCanada
  2. 2.School of Computer Science and EngineeringUniversity of New South WalesSydneyAustralia
  3. 3.Dept. of Applied Physics Pattern Recognition GroupDelft University of TechnologyDelftThe Netherlands
  4. 4.Dept. of Systems Design EngineeringUniversity of WaterlooWaterlooCanada

Bibliographic information

  • DOI https://doi.org/10.1007/3-540-70659-3
  • Copyright Information Springer-Verlag Berlin Heidelberg 2002
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Springer Book Archive
  • Print ISBN 978-3-540-44011-6
  • Online ISBN 978-3-540-70659-5
  • Series Print ISSN 0302-9743
  • Buy this book on publisher's site