Transmission Electron Microscopy and Diffractometry of Materials

  • Brent Fultz
  • James Howe

Part of the Graduate Texts in Physics book series (GTP)

Table of contents

  1. Front Matter
    Pages I-XX
  2. Brent Fultz, James Howe
    Pages 1-57
  3. Brent Fultz, James Howe
    Pages 59-115
  4. Brent Fultz, James Howe
    Pages 117-144
  5. Brent Fultz, James Howe
    Pages 145-180
  6. Brent Fultz, James Howe
    Pages 181-236
  7. Brent Fultz, James Howe
    Pages 237-288
  8. Brent Fultz, James Howe
    Pages 289-348
  9. Brent Fultz, James Howe
    Pages 349-427
  10. Brent Fultz, James Howe
    Pages 429-462
  11. Brent Fultz, James Howe
    Pages 463-520
  12. Brent Fultz, James Howe
    Pages 521-586
  13. Brent Fultz, James Howe
    Pages 587-615
  14. Brent Fultz, James Howe
    Pages 617-679
  15. Back Matter
    Pages 681-761

About this book

Introduction

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Keywords

Characterization of Materials Dark-Field and Bright-Field Imaging Diffraction and Imaging Diffraction from Crystals Imaging Lens Systems Neutron Scattering Small-Angle Scattering Theory of Electron Microscopy and X-Ray Diffraction Transmission Electron Microscopy X-Ray Diffractometry

Authors and affiliations

  • Brent Fultz
    • 1
  • James Howe
    • 2
  1. 1.Dept. Engineering &, Materials SciencesCalifornia Institute of TechnologyPasadenaUSA
  2. 2.Dept. Materials Science and EngineeringUniversity of VirginiaCharlottesvilleUSA

Bibliographic information

  • DOI https://doi.org/10.1007/978-3-642-29761-8
  • Copyright Information Springer-Verlag Berlin Heidelberg 2013
  • Publisher Name Springer, Berlin, Heidelberg
  • eBook Packages Physics and Astronomy
  • Print ISBN 978-3-642-29760-1
  • Online ISBN 978-3-642-29761-8
  • Series Print ISSN 1868-4513
  • Series Online ISSN 1868-4521
  • About this book