Advertisement

Inelastic Electron Scattering and Spectroscopy

  • Brent Fultz
  • James Howe
Part of the Graduate Texts in Physics book series (GTP)

Abstract

Chapter  4 presented elastic scattering of electrons, and Chap. 5 presents inelastic scattering. The different physical mechanisms important for electron energy loss spectrometry (EELS) are described—interband transitions, plasmons, and core excitations. Near-edge structure and extended fine structure are useful methods for studying the chemical composition and local structure of materials, and these are developed with examples. The operation of an EELS spectrometer and the intensities of measured spectra are explained. Energy-filtered imaging is described. EELS core spectra originate from primary ionizations of atoms, and the subsequent x-ray emissions are the basis for energy dispersive x-ray spectrometry (EDXS). It is fortunate that the EDS method gives good sensitivity for elements over much of the periodic table—the probabilities for ionization and for x-ray emission have strong, but compensating, chemical trends. The EDS method is a workhorse tool for fine-scale chemical analysis of materials. Some practical issues are described, with discussions of spatial resolution, accuracy and sensitivity of EDS methods.

Keywords

Inelastic Scattering Atomic Electron Plasmon Peak Electron Energy Loss Spectrometry Spectrum Generalize Oscillator Strength 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Copyright information

© Springer-Verlag Berlin Heidelberg 2013

Authors and Affiliations

  • Brent Fultz
    • 1
  • James Howe
    • 2
  1. 1.Dept. Applied Physics and Materials ScienceCalifornia Institute of TechnologyPasadenaUSA
  2. 2.Dept. Materials Science and EngineeringUniversity of VirginiaCharlottesvilleUSA

Personalised recommendations