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Estimation of the concentration of charge carriers in a conductive layer between LaAlO3 and SrTiO3 dielectrics

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Journal of Contemporary Physics (Armenian Academy of Sciences) Aims and scope

Abstract

Using the capacitor model by Goetzberger, the concentration of charge carriers on the contact layer LAO’STO is evaluated. The obtained results are shown to be comparable with those obtained within the framework of “polar catastrophe” model. Some possible interpretations of charge carriers, concentration variations, depending on the thickness of deposited layers, are presented as well, both for the “pure” (LAO) and composite (LASTO) ones.

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Authors and Affiliations

  1. Institute for Physical Research, NAS of Armenia, Ashtarak, Armenia

    A. V. Eganyan

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  1. A. V. Eganyan
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Correspondence to A. V. Eganyan.

Additional information

Original Russian Text © A.V. Eganyan, 2013, published in Izvestiya NAN Armenii, Fizika, 2013, Vol. 48, No. 3, pp. 208–211.

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Eganyan, A.V. Estimation of the concentration of charge carriers in a conductive layer between LaAlO3 and SrTiO3 dielectrics. J. Contemp. Phys. 48, 138–140 (2013). https://doi.org/10.3103/S1068337213030080

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  • DOI: https://doi.org/10.3103/S1068337213030080

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