Abstract
Properties of defect modes in chiral photonic crystals with an anisotropic defect are considered. The influence of the defect layer thickness, its location in the crystal and orientation of its optical axis, as well as of the chiral photonic crystal thickness on the properties of defect modes is studied. It is shown that at certain values of the defect layer thickness the medium loses its main property, namely, the polarization dependence of the diffraction reflection. At certain thicknesses of the defect layer this system transforms from the source of the right circular polarization into the source of the left circular polarization, if the layer position in the chiral photonic crystal changes.
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Original Russian Text © M.Z. Harutyunyan, A.H. Gevorgyan, 2007, published in Izvestiya NAN Armenii, Fizika, 2007, Vol. 42, No. 5, pp. 289–296.
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Harutyunyan, M.Z., Gevorgyan, A.H. Optical properties of chiral photonic crystals with an anisotropic defect layer. J. Contemp. Phys. 42, 190–194 (2007). https://doi.org/10.3103/S1068337207050050
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DOI: https://doi.org/10.3103/S1068337207050050