Abstract
In the present work, effect of growth rates on microhardness, electrical properties and microstructure for directionally solidified Al–13 wt % Mg2Si pseudoeutectic alloy at a constant temperature gradient were studied. Directional solidification process were carried out with five different growth rates (V = 8.33–175.0 μm/s) at a constant temperature gradient (G = 6.68 K/mm) by using a Bridgman type directional solidification furnace. Microstructure of directionally solidified Al–13 wt % Mg2Si pseudoeutectic alloy was observed as Mg2Si coral-like structure phase dispersed into primary α-Al phase matrix. The electrical resistivity for Al–13 wt % Mg2Si pseudoeutectic alloy, were measured by the d.c. four-point probe method. The dependency ofmicrohardness and electrical resistivity on growth rates were obtained as HV = 135.7 (V)0.09 and ρ = 17.30 × 10−8(V)0.08, respectively for Al–Mg2Si pseudoeutectic alloy. The results obtained in present work were compared with the previous similar experimental results.
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Kaygısız, Y., Maraşlı, N. Hardness and electrical resistivity of Al–13 wt % Mg2Si pseudoeutectic alloy. Russ. J. Non-ferrous Metals 58, 15–21 (2017). https://doi.org/10.3103/S1067821217010060
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DOI: https://doi.org/10.3103/S1067821217010060