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Procedure for modeling the distribution of doping components using data from X-ray diffraction experiments

  • Proceedings of the International Symposium “Physics of Crystals 2013”
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Bulletin of the Russian Academy of Sciences: Physics Aims and scope

Abstract

An X-ray diffraction procedure is proposed for modeling the distribution of components in the depth of an alloy by analyzing the integral intensity, shape, and width of diffraction peaks of two orders of reflection. The procedure is used to refine data on the phase composition and distribution of indium atoms in the depth of hydrogenised Pd-In-Ru alloy after its long-term relaxation.

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Authors and Affiliations

  1. Faculty of Physics, Moscow State University, Moscow, 119991, Russia

    O. V. Akimova, V. M. Avdyukhina, I. S. Levin & G. P. Revkevich

Authors
  1. O. V. Akimova
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  2. V. M. Avdyukhina
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  3. I. S. Levin
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  4. G. P. Revkevich
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Corresponding author

Correspondence to O. V. Akimova.

Additional information

Original Russian Text © O.V. Akimova, V.M. Avdyukhina, I.S. Levin, G.P. Revkevich, 2014, published in Izvestiya Rossiiskoi Akademii Nauk. Seriya Fizicheskaya, 2014, Vol. 78, No. 11, pp. 1443–1448.

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Akimova, O.V., Avdyukhina, V.M., Levin, I.S. et al. Procedure for modeling the distribution of doping components using data from X-ray diffraction experiments. Bull. Russ. Acad. Sci. Phys. 78, 1174–1178 (2014). https://doi.org/10.3103/S1062873814110033

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  • DOI: https://doi.org/10.3103/S1062873814110033

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